| Study of texture effect on elastic properties of Au thin films by X-ray diffraction and in situ tensile testing D Faurie, PO Renault, E Le Bourhis, P Goudeau Acta Materialia 54 (17), 4503-4513, 2006 | 86 | 2006 |
| Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data PO Renault, E Le Bourhis, P Villain, P Goudeau, KF Badawi, D Faurie Applied Physics Letters 83 (3), 473-475, 2003 | 75 | 2003 |
| Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response G Geandier, D Thiaudière, RN Randriamazaoro, R Chiron, S Djaziri, ... Review of Scientific Instruments 81 (10), 2010 | 59 | 2010 |
| In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation D Faurie, O Castelnau, R Brenner, PO Renault, E Le Bourhis, P Goudeau Journal of Applied Crystallography 42 (6), 1073-1084, 2009 | 55 | 2009 |
| Bending strain-tunable magnetic anisotropy in Co2FeAl Heusler thin film on Kapton® M Gueye, BM Wague, F Zighem, M Belmeguenai, MS Gabor, T Petrisor, ... Applied Physics Letters 105 (6), 2014 | 51 | 2014 |
| Voltage-induced strain control of the magnetic anisotropy in a Ni thin film on flexible substrate F Zighem, D Faurie, S Mercone, M Belmeguenai, H Haddadi Journal of Applied Physics 114 (7), 2013 | 49 | 2013 |
| Structural and elastic properties of ternary metal nitrides TixTa1− xN alloys: First-principles calculations versus experiments P Djemia, M Benhamida, K Bouamama, L Belliard, D Faurie, G Abadias Surface and Coatings Technology 215, 199-208, 2013 | 47 | 2013 |
| Elastic anisotropy of polycrystalline Au films: Modeling and respective contributions of X-ray diffraction, nanoindentation and Brillouin light scattering D Faurie, P Djémia, E Le Bourhis, PO Renault, Y Roussigné, SM Cherif, ... Acta Materialia 58 (15), 4998-5008, 2010 | 47 | 2010 |
| Measurement of thin film elastic constants by X-ray diffraction D Faurie, PO Renault, E Le Bourhis, P Villain, P Goudeau, F Badawi Thin Solid Films 469, 201-205, 2004 | 46 | 2004 |
| Synchrotron X-ray diffraction experiments with a prototype hybrid pixel detector C Le Bourlot, P Landois, S Djaziri, PO Renault, E Le Bourhis, P Goudeau, ... Journal of Applied Crystallography 45 (1), 38-47, 2012 | 45 | 2012 |
| Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton S Djaziri, PO Renault, F Hild, E Le Bourhis, P Goudeau, D Thiaudière, ... Journal of Applied Crystallography 44 (5), 1071-1079, 2011 | 44 | 2011 |
| Determination of elastic constants of a fiber-textured gold film by combining synchrotron x-ray diffraction and in situ tensile testing D Faurie, PO Renault, E Le Bourhis, P Goudeau Journal of applied physics 98 (9), 2005 | 37 | 2005 |
| Elastic-strain distribution in metallic film-polymer substrate composites G Geandier, PO Renault, E Le Bourhis, P Goudeau, D Faurie, ... Applied Physics Letters 96 (4), 2010 | 35* | 2010 |
| Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates S Djaziri, PO Renault, E Le Bourhis, P Goudeau, D Faurie, G Geandier, ... Journal of Applied Physics 116 (9), 2014 | 32 | 2014 |
| Yield surface of polycrystalline thin films as revealed by non-equibiaxial loadings at small deformation S Djaziri, D Faurie, PO Renault, E Le Bourhis, P Goudeau, G Geandier, ... Acta materialia 61 (13), 5067-5077, 2013 | 31 | 2013 |
| Laue-DIC: a new method for improved stress field measurements at the micrometer scale J Petit, O Castelnau, M Bornert, FG Zhang, F Hofmann, AM Korsunsky, ... Journal of Synchrotron Radiation 22 (4), 980-994, 2015 | 27 | 2015 |
| In situ x-ray diffraction analysis of 2D crack patterning in thin films D Faurie, F Zighem, P Godard, G Parry, T Sadat, D Thiaudière, ... Acta Materialia 165, 177-182, 2019 | 26 | 2019 |
| Bulk Ni–W alloys with a composite-like microstructure processed by spark plasma sintering: Microstructure and mechanical properties T Sadat, G Dirras, D Tingaud, M Ota, T Chauveau, D Faurie, S Vajpai, ... Materials & Design 89, 1181-1190, 2016 | 26 | 2016 |
| Elastic behavior of polycrystalline thin films inferred from in situ micromechanical testing and modeling D Faurie, PO Renault, E Le Bourhis, P Goudeau, O Castelnau, R Brenner, ... Applied physics letters 89 (6), 2006 | 25 | 2006 |
| Deformation modes of nanostructured thin film under controlled biaxial deformation S Djaziri, D Faurie, E Le Bourhis, P Goudeau, PO Renault, C Mocuta, ... Thin Solid Films 530, 30-34, 2013 | 24 | 2013 |
Pierre-Olivier Renaultuniversité de Poitiers在 univ-poitiers.fr 的电子邮件经过验证
