| Vectorial structure of nonparaxial electromagnetic beams R Martınez-Herrero, PM Mejıas, S Bosch, A Carnicer Journal of the Optical Society of America A 18 (7), 1678-1680, 2001 | 134 | 2001 |
| Ultraviolet optical and microstructural properties of MgF2 and LaF3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation D Ristau, S Günster, S Bosch, A Duparre, E Masetti, J Ferre-Borrull, ... Applied optics 41 (16), 3196-3204, 2002 | 131 | 2002 |
| Dark modes and Fano resonances in plasmonic clusters excited by cylindrical vector beams J Sancho-Parramon, S Bosch ACS nano 6 (9), 8415-8423, 2012 | 130 | 2012 |
| Effective dielectric function of mixtures of three or more materials: a numerical procedure for computations S Bosch, J Ferre-Borrull, N Leinfellner, A Canillas Surface science 453 (1-3), 9-17, 2000 | 115 | 2000 |
| Relation between 2D/3D chirality and the appearance of chiroptical effects in real nanostructures O Arteaga, J Sancho-Parramon, S Nichols, BM Maoz, A Canillas, S Bosch, ... Optics express 24 (3), 2242-2252, 2016 | 96 | 2016 |
| Diffraction theory of Fresnel lenses encoded in low-resolution devices E Carcolé, J Campos, S Bosch Applied optics 33 (2), 162-174, 1994 | 83 | 1994 |
| A general-purpose software for optical characterization of thin films: specific features for microelectronic applications S Bosch, J Ferré-Borrull, J Sancho-Parramon Solid-State Electronics 45 (5), 703-709, 2001 | 62 | 2001 |
| Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion J Sancho-Parramon, M Modreanu, S Bosch, M Stchakovsky Thin Solid Films 516 (22), 7990-7995, 2008 | 53 | 2008 |
| Plasmonic layers based on Au-nanoparticle-doped TiO2 for optoelectronics: structural and optical properties E Pedrueza, J Sancho-Parramon, S Bosch, JL Valdes, JP Martinez-Pastor Nanotechnology 24 (6), 065202, 2013 | 47 | 2013 |
| Spectroscopic ellipsometric study of tetrahedral amorphous carbon films: optical properties and modelling A Canillas, MC Polo, JL Andujar, J Sancho, S Bosch, J Robertson, ... Diamond and related materials 10 (3-7), 1132-1136, 2001 | 38 | 2001 |
| Phase mask selection in wavefront coding systems: A design approach G Carles, A Carnicer, S Bosch Optics and Lasers in Engineering 48 (7-8), 779-785, 2010 | 31 | 2010 |
| Use of a spatial light modulator as an adaptable phase mask for wavefront coding G Carles, G Muyo, S Bosch, AR Harvey Journal of Modern Optics 57 (10), 893-900, 2010 | 27 | 2010 |
| Ellipsometric methods for absorbing layers: a modified downhill simplex algorithm S Bosch, F Monzonis, E Masetti Thin Solid Films 289 (1-2), 54-58, 1996 | 27 | 1996 |
| Design of surface forces apparatus for tribology studies combined with nonlinear optical spectroscopy P Frantz, F Wolf, X Xiao, Y Chen, S Bosch, M Salmeron Review of scientific instruments 68 (6), 2499-2504, 1997 | 24 | 1997 |
| Effective medium models for metal-dielectric composites: an analysis based on the spectral density theory J Sancho-Parramon, S Bosch, A Abdolvand, A Podlipensky, G Seifert, ... Advances in Optical Thin Films II 5963, 556-566, 2005 | 23 | 2005 |
| UV-optical and microstructural properties of MgF2-coatings deposited by IBS and PVD processes D Ristau, W Arens, S Bosch, A Duparre, E Masetti, D Jacob, G Kiriakidis, ... Advances in Optical Interference Coatings 3738, 436-445, 1999 | 23 | 1999 |
| Spectroscopic ellipsometric characterization of transparent thin film amorphous electronic materials: integrated analysis KV Popov, AV Tikhonravov, J Campmany, E Bertran, S Bosch, A Canillas Thin Solid Films 313, 379-383, 1998 | 22 | 1998 |
| General inversion method for single-wavelength ellipsometry of samples with an arbitrary number of layers S Bosch, F Monzonis JOSA A 12 (6), 1375-1379, 1995 | 22 | 1995 |
| Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization J Sancho-Parramon, J Ferre-Borrull, S Bosch, MC Ferrara Applied optics 42 (7), 1325-1329, 2003 | 20 | 2003 |
| Spectrophotometric determination of absorption in the DUV/VUV spectral range for MgF2 and LaF3 thin films S Guenster, D Ristau, S Bosch Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage …, 2000 | 19 | 2000 |
