| Effective DC fault models and testing approach for open defects in analog circuits B Esen, A Coyette, G Gielen, W Dobbelaere, R Vanhooren 2016 IEEE International Test Conference (ITC), 1-9, 2016 | 31 | 2016 |
| Analog fault coverage improvement using final-test dynamic part average testing W Dobbelaere, R Vanhooren, W De Man, K Matthijs, A Coyette, B Esen, ... 2016 IEEE International Test Conference (ITC), 1-9, 2016 | 25 | 2016 |
| Design and test of analog circuits towards sub-ppm level G Gielen, W Dobbelaere, R Vanhooren, A Coyette, B Esen 2014 International Test Conference, 1-2, 2014 | 24 | 2014 |
| Optimization of analog fault coverage by exploiting defect-specific masking A Coyette, G Gielen, R Vanhooren, W Dobbelaere 2014 19th IEEE European Test Symposium (ETS), 1-6, 2014 | 21 | 2014 |
| Automated testing of mixed-signal integrated circuits by topology modification A Coyette, B Esen, R Vanhooren, W Dobbelaere, G Gielen 2015 IEEE 33rd VLSI Test Symposium (VTS), 1-6, 2015 | 20 | 2015 |
| The process of designing integrated stem learning materials: Case study towards an evidence-based model. J De Meester, M De Cock, G Langie, W Dehaene European Journal of STEM Education 6 (1), 10, 2021 | 18 | 2021 |
| Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs W Dobbelaere, F Colle, A Coyette, R Vanhooren, N Xama, J Gomez, ... 2019 IEEE International Test Conference (ITC), 1-4, 2019 | 15 | 2019 |
| Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization A Coyette, B Esen, W Dobbelaere, R Vanhooren, G Gielen Integration 55, 393-400, 2016 | 15 | 2016 |
| Automatic testing of analog ICs for latent defects using topology modification N Xama, A Coyette, B Esen, W Dobbelaere, R Vanhooren, G Gielen 2017 22nd IEEE European Test Symposium (ETS), 1-6, 2017 | 12 | 2017 |
| Automatic generation of autonomous built-in observability structures for analog circuits A Coyette, B Esen, R Vanhooren, W Dobbelaere, G Gielen 2015 20th IEEE European Test Symposium (ETS), 1-6, 2015 | 10 | 2015 |
| Recent trends and perspectives on defect-oriented testing P Bernardi, R Cantoro, A Coyette, W Dobbeleare, M Fieback, A Floridia, ... 2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022 | 9 | 2022 |
| Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis A Coyette, B Esen, W Dobbelaere, R Vanhooren, G Gielen 2016 IEEE International Test Conference (ITC), 1-10, 2016 | 9 | 2016 |
| Analog fault coverage improvement using defect-specific masking W Dobbelaere, R Vanhooren, A Coyette, G Gielen VOICE conference, 2014 | 9 | 2014 |
| Pinhole latent defect modeling and simulation for defect-oriented analog/mixed-signal testing J Gomez, N Xama, A Coyette, R Vanhooren, W Dobbelaere, G Gielen 2020 IEEE 38th VLSI Test Symposium (VTS), 1-6, 2020 | 7 | 2020 |
| A very low cost and highly parallel DfT method for analog and mixed-signal circuits B Esen, A Coyette, N Xama, W Dobbelaere, R Vanhooren, G Gielen 2017 22nd IEEE European Test Symposium (ETS), 1-2, 2017 | 7 | 2017 |
| Machine learning-based defect coverage boosting of analog circuits under measurement variations N Xama, M Andraud, J Gomez, B Esen, W Dobbelaere, R Vanhooren, ... ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (5 …, 2020 | 5 | 2020 |
| Avoiding mixed-signal field returns by outlier detection of hard-to-detect defects based on multivariate statistics N Xama, J Raymaekers, M Andraud, J Gomez, W Dobbelaere, ... 2020 IEEE European Test Symposium (ETS), 1-6, 2020 | 5 | 2020 |
| Latent defect screening with visually-enhanced dynamic part average testing A Coyette, W Dobbelaere, R Vanhooren, N Xama, J Gomez, G Gielen 2020 IEEE European Test Symposium (ETS), 1-6, 2020 | 5 | 2020 |
| ADAGE: Automatic DfT-assisted generation of test stimuli for mixed-signal integrated circuits A Coyette, B Esen, N Xama, G Gielen, W Dobbelaere, R Vanhooren IEEE Design & Test 35 (3), 24-30, 2018 | 5 | 2018 |
| Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs S Sunter, M Wolinski, A Coyette, R Vanhooren, W Dobbelaere, N Xama, ... 2020 IEEE International Test Conference (ITC), 1-10, 2020 | 4 | 2020 |
