| An adjustable-stiffness MEMS force sensor: Design, characterization, and control M Maroufi, H Alemansour, MB Coskun, SOR Moheimani Mechatronics 56, 198-210, 2018 | 39 | 2018 |
| Effect of size on the chaotic behavior of nano resonators H Alemansour, EM Miandoab, HN Pishkenari Communications in Nonlinear Science and Numerical Simulation 44, 495-505, 2017 | 36 | 2017 |
| Control of an Active AFM Cantilever With Differential Sensing Configuration MB Coskun, H Alemansour, AG Fowler, M Maroufi, SOR Moheimani IEEE Transactions on Control Systems Technology 27 (5), 2271-2278, 2018 | 33 | 2018 |
| A high dynamic range closed-loop stiffness-adjustable MEMS force sensor M Maroufi, H Alemansour, SOR Moheimani Journal of Microelectromechanical Systems 29 (3), 397-407, 2020 | 14 | 2020 |
| Controlled removal of hydrogen atoms from H-terminated silicon surfaces H Alemansour, SO Moheimani, JHG Owen, JN Randall, E Fuchs Journal of Vacuum Science & Technology B 38 (4), 2020 | 12 | 2020 |
| Ultrafast method for scanning tunneling spectroscopy H Alemansour, SO Moheimani, JHG Owen, JN Randall, E Fuchs Journal of Vacuum Science & Technology B 39 (4), 2021 | 10 | 2021 |
| High signal-to-noise ratio differential conductance spectroscopy H Alemansour, SO Moheimani, JHG Owen, JN Randall, E Fuchs Journal of Vacuum Science & Technology B 39 (1), 2021 | 9 | 2021 |
| A closed-loop MEMS force sensor with adjustable stiffness M Maroufi, H Alemansour, SOR Moheimani 2017 IEEE Conference on Control Technology and Applications (CCTA), 438-443, 2017 | 8 | 2017 |
| A new approach to removing H atoms in hydrogen depassivation lithography SOR Moheimani, H Alemansour Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2020 …, 2020 | 6 | 2020 |
| A highly integrated AFM-SEM correlative analysis platform A Alipour, KT Arat, H Alemansour, L Montes, J Gardiner, J Diederichs, ... Microscopy Today 31 (6), 17-22, 2023 | 4 | 2023 |
| A New Correlative Microscopy Platform Integrating AFM with in situ SEM K Arat, H Alemansour, A Aman, L Montes, J Gardiner, CH Schwalb, ... Microscopy and Microanalysis 29 (Supplement_1), 1944-1945, 2023 | 2 | 2023 |
| Biomechanics characterization of autonomic and somatic nerves by high dynamic closed-loop MEMS force sensing MA González-González, H Alemansour, M Maroufi, MB Coskun, D Lloyd, ... bioRxiv, 2023 | 2 | 2023 |
| A feedback controlled MEMS probe scanner for on-chip AFM H Alemansour, M Maroufi, A Alipour, SOR Moheimani IFAC-PapersOnLine 52 (15), 295-300, 2019 | 2 | 2019 |
| Design and Characterization of a MEMS Probe Scanner for On-chip Atomic Force Microscopy M Maroufi, A Alipour, H Alemansour, SOR Moheimani 2019 International Conference on Manipulation, Automation and Robotics at …, 2019 | 2 | 2019 |
| Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software SOR Moheimani, H Alemansour Univ. of Texas, Austin, TX (United States), 2023 | 1 | 2023 |
| Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software SOR Moheimani, H Alemansour US Patent 11,143,671, 2021 | 1 | 2021 |
| Model-Based Control of the Scanning Tunneling Microscope: Enabling New Modes of Imaging, Spectroscopy, and Lithography H Alemansour, SOR Moheimani IEEE Control Systems Magazine 44 (1), 46-66, 2024 | | 2024 |
| Model-based Control of the Scanning Tunneling Microscope: Enabling New Modes of Imaging, Spectroscopy, and Lithography H Alemansour, SO Moheimani arXiv preprint arXiv:2310.18833, 2023 | | 2023 |
| Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software SOR Moheimani, H Alemansour US Patent 11,650,222, 2023 | | 2023 |
| Development of Probe-based Devices and Methods for Applications in Micro/Nano Characterization and Fabrication H Alemansour | | 2022 |
Reza MoheimaniProfessor & James Von Ehr Distinguished Chair, Dept of Mechanical Engineering, UT-Dallas在 utdallas.edu 的电子邮件经过验证
