关注
Massimo Ortolano
标题
引用次数
引用次数
年份
Experiences with a two-terminal-pair digital impedance bridge
L Callegaro, V D’Elia, M Kampik, DB Kim, M Ortolano, F Pourdanesh
IEEE Transactions on Instrumentation and Measurement 64 (6), 1460-1465, 2015
622015
Mapping the conductivity of graphene with Electrical Resistance Tomography
A Cultrera, D Serazio, A Zurutuza, A Centeno, O Txoperena, D Etayo, ...
Scientific reports 9 (1), 10655, 2019
462019
Atypical quantized resistances in millimeter-scale epitaxial graphene pn junctions
AF Rigosi, D Patel, M Marzano, M Kruskopf, HM Hill, H Jin, J Hu, ...
Carbon 154, 230-237, 2019
412019
An international comparison of phase angle standards between the novel impedance bridges of CMI, INRIM and METAS
M Ortolano, L Palafox, J Kučera, L Callegaro, V D’Elia, M Marzano, ...
Metrologia 55 (4), 499, 2018
342018
On the synthesis of quantum Hall array resistance standards
M Ortolano, M Abrate, L Callegaro
Metrologia 52 (1), 31, 2014
322014
A precise two-channel digitally synthesized AC voltage source for impedance metrology
J Nissilä, K Ojasalo, M Kampik, J Kaasalainen, V Maisi, M Casserly, ...
29th Conference on Precision Electromagnetic Measurements (CPEM 2014), 768-769, 2014
232014
Noise characterization of analog to digital converters for amplitude and phase noise measurements
AC Cárdenas-Olaya, E Rubiola, JM Friedt, PY Bourgeois, M Ortolano, ...
Review of Scientific Instruments 88 (6), 2017
202017
A comprehensive analysis of error sources in electronic fully digital impedance bridges
M Ortolano, M Marzano, V D’Elia, NTM Tran, R Rybski, J Kaczmarek, ...
IEEE Transactions on Instrumentation and Measurement 70, 1-14, 2020
172020
Circuit models and SPICE macro-models for quantum Hall effect devices
M Ortolano, L Callegaro
Measurement Science and Technology 26 (8), 085018, 2015
172015
Metrological characterization of consumer-grade equipment for wearable brain–computer interfaces and extended reality
P Arpaia, L Callegaro, A Cultrera, A Esposito, M Ortolano
IEEE Transactions on Instrumentation and Measurement 71, 1-9, 2021
162021
Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications
P Arpaia, L Callegaro, A Cultrera, A Esposito, M Ortolano
2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT …, 2021
152021
A correlation noise spectrometer for flicker noise measurement in graphene samples
M Marzano, A Cultrera, M Ortolano, L Callegaro
Measurement Science and Technology 30 (3), 035102, 2019
152019
A capacitance build-up method to determine LCR meter errors and capacitance transfer
NTM Tran, V D’Elia, L Callegaro, M Ortolano
IEEE Transactions on Instrumentation and Measurement 69 (8), 5727-5735, 2019
122019
Error modelling of quantum Hall array resistance standards
M Marzano, T Oe, M Ortolano, L Callegaro, NH Kaneko
Metrologia 55 (2), 167, 2018
122018
Digital electronics based on red pitaya platform for coherent fiber links
ACC Olaya, S Micalizio, M Ortolano, CE Calosso, E Rubiola, JM Friedt
2016 European Frequency and Time Forum (EFTF), 1-4, 2016
122016
A three-arm current comparator bridge for impedance comparisons over the complex plane
L Callegaro, V D’Elia, M Ortolano, F Pourdanesh
IEEE Transactions on Instrumentation and Measurement 64 (6), 1466-1471, 2015
122015
Matrix method analysis of quantum Hall effect device connections
M Ortolano, L Callegaro
Metrologia 49 (1), 1, 2011
122011
A fully digital bridge towards the realization of the farad from the quantum Hall effect
M Marzano, M Ortolano, V D’Elia, A Müller, L Callegaro
Metrologia 58 (1), 015002, 2020
112020
Systematic errors in the correlation method for Johnson noise thermometry: residual correlations due to amplifiers
L Callegaro, M Pisani, M Ortolano
Metrologia 47 (3), 272, 2010
112010
Realization and metrological characterization of a compact high-resolution pendulum tiltmeter
M Berutto, M Ortolano, F Periale, A De Marchi
IEEE Sensors Journal 5 (1), 26-31, 2005
112005
系统目前无法执行此操作,请稍后再试。
文章 1–20