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Rahman Sajadi
Rahman Sajadi
ON Semiconductor Inc
在 onsemi.com 的电子邮件经过验证
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引用次数
引用次数
年份
Selective harmonic elimination technique with control of capacitive DC-link voltages in an asymmetric cascaded H-bridge inverter for STATCOM application
R Sajadi, H Iman-Eini, MK Bakhshizadeh, Y Neyshabouri, S Farhangi
IEEE Transactions on Industrial Electronics 65 (11), 8788-8796, 2018
1042018
Improving the reactive current compensation capability of cascaded H-bridge based STATCOM under unbalanced grid voltage
Y Neyshabouri, SK Chaudhary, R Teodorescu, R Sajadi, H Iman-Eini
IEEE Journal of Emerging and Selected Topics in Power Electronics 8 (2 …, 2019
702019
AC power cycling test setup and condition monitoring tools for SiC-based traction inverters
M Farhadi, BT Vankayalapati, R Sajadi, B Akin
IEEE Transactions on Vehicular Technology 72 (10), 12728-12743, 2023
122023
A practical switch condition monitoring solution for SiC traction inverters
BT Vankayalapati, M Farhadi, R Sajadi, B Akin, H Tan
IEEE Journal of Emerging and Selected Topics in Power Electronics 11 (2 …, 2022
102022
Using variable DC sources in order to improve the voltage quality of a multilevel STATCOM with low frequency modulation
MK Bakhshizadeh, M Najjar, F Blaabjerg, R Sajadi
2016 18th European Conference on Power Electronics and Applications (EPE'16 …, 2016
82016
Gate-oxide degradation monitoring of SiC MOSFETs based on transfer characteristic with temperature compensation
M Farhadi, BT Vankayalapati, R Sajadi, B Akin
IEEE Transactions on Transportation Electrification 10 (1), 1837-1849, 2023
62023
Small-signal analysis of cascaded multilevel H-bridge inverter for PV integration
R Sajadi, J Khazaei
2020 52nd North American Power Symposium (NAPS), 1-6, 2021
32021
Reliability Evaluation of Isolated LDMOS Devices and Condition Monitoring Solution
R Sajadi, C Xu, BT Vankayalapati, M Farhadi, B Akin
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2024
12024
Third Quadrant Operation of SiC MOSFETs: Comprehensive Analysis and Condition Monitoring Solution
R Sajadi, E Ugur, M Farhadi, BT Vankayalapati, A Saadat, ...
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2024
12024
Switching Transient Based Junction Temperature Estimation of SiC MOSFETs With Aging Compensation
M Farhadi, R Sajadi, BT Vankayalapati, B Akin
IEEE Transactions on Power Electronics, 2024
2024
Model Based Junction Temperature Profile Control of SiC MOSFETs in DC Power Cycling for Accurate Reliability Assessments
BT Vankayalapati, R Sajadi, MA CN, AV Deshmukh, M Farhadi, B Akin
IEEE Transactions on Industry Applications, 2024
2024
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