An Energy-Efficient One-Shot Time-Based Neural Network Accelerator Employing Dynamic Threshold Error Correction in 65 nm LR Everson, M Liu, N Pande, CH Kim IEEE Journal of Solid-State Circuits 54 (10), 2777-2785, 2019 | 32 | 2019 |
A non-volatile near-memory read mapping accelerator SK Khatamifard, ZI Chowdhury, N Pande, M Razaviyayn, CH Kim, ... arXiv preprint arXiv:1709.02381, 2017 | 18 | 2017 |
GeNVoM: Read mapping near non-volatile memory SK Khatamifard, Z Chowdhury, N Pande, M Razaviyayn, C Kim, ... IEEE/ACM Transactions on Computational Biology and Bioinformatics 19 (6 …, 2021 | 14 | 2021 |
A 104.8 TOPS/W One-Shot Time-Based Neuromorphic Chip Employing Dynamic Threshold Error Correction in 65nm LR Everson, M Liu, N Pande, CH Kim 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC), 273-276, 2018 | 14 | 2018 |
Read Mapping Near Non-Volatile Memory SK Khatamifard, Z Chowdhury, N Pande, M Razaviyayn, C Kim, ... arXiv preprint arXiv:1709.02381, 2017 | 13 | 2017 |
Characterizing Electromigration Effects in a 16nm FinFET Process Using a Circuit Based Test Vehicle N Pande, C Zhou, MH Lin, R Fung, R Wong, S Wen, CH Kim 2019 IEEE International Electron Devices Meeting (IEDM), 5.3. 1-5.3. 4, 2019 | 12 | 2019 |
Understanding the Key Parameter Dependences Influencing the Soft-Error Susceptibility of Standard Combinational Logic N Pande, S Kumar, LR Everson, CH Kim IEEE Transactions on Nuclear Science 67 (1), 116-125, 2019 | 10 | 2019 |
Understanding the Key Parameter Dependencies Influencing the Soft-Error Susceptibility of Standard Combinational Logic N Pande, S Kumar, LR Everson, CH Kim 2019 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2019 | 10 | 2019 |
Room temperature ferromagnetism in thermally diffused Cr in GaN P Suggisetti, D Banerjee, R Adari, N Pande, T Patil, S Ganguly, D Saha AIP Advances 3 (3), 2013 | 9 | 2013 |
Investigating the Aging Dynamics of Diode-connected MOS Devices using an Array-based Characterization Vehicle in a 65nm Process N Pande, G Park, CH Kim, S Krishnan, V Reddy 2019 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2019 | 7 | 2019 |
A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing G Park, M Kim, N Pande, PW Chiu, J Song, CH Kim 2019 IEEE Custom Integrated Circuits Conference (CICC), 1-4, 2019 | 4 | 2019 |
On-chip Heater Design and Control Methodology for Reliability Testing Applications Requiring over 300∘C Local Temperatures H Yu, Y Yi, N Pande, CH Kim IEEE Transactions on Device and Materials Reliability, 2023 | 3 | 2023 |
Electromigration-Induced Bit-Error-Rate Degradation of Interconnect Signal Paths Characterized from a 16nm Test Chip N Pande, C Zhou, MH Lin, R Fung, R Wong, S Wen, CH Kim 2021 Symposium on VLSI Technology, 1-2, 2021 | 3 | 2021 |
A 16nm All-Digital Hardware Monitor for Evaluating Electromigration Effects in Signal Interconnects Through Bit-Error-Rate Tracking N Pande, C Zhou, MH Lin, R Fung, R Wong, SJ Wen, CH Kim IEEE Transactions on Device and Materials Reliability 22 (2), 194-204, 2022 | 2 | 2022 |
Neutron-Induced Pulse Width Distribution of Logic Gates Characterized Using a Pulse Shrinking Chain Based Test Structure N Pande, S Kumar, LR Everson, G Park, I Ahmed, CH Kim IEEE Transactions on Nuclear Science, 2021 | 2 | 2021 |
Array-Based On-Chip Hardware Monitors for Statistically Efficient Integrated Circuit Reliability Characterization N Pande University of Minnesota, 2020 | | 2020 |
Neutron-Induced Pulse Width Distribution of Logic Gates Characterized Using a Pulse Shrinking Chain Based Test Structure N Pande, S Kumar, LR Everson, G Park, I Ahmed, CH Kim IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2020 | | 2020 |
Large excitonic binding energy in GaN based superluminescent light emitting diode on naturally survived sub-10 nm lateral nanowires D Banerjee, MB Nadar, P Upadhyay, R Singla, S Sankaranarayanan, ... arXiv preprint arXiv:1503.02279, 2015 | | 2015 |
Dry Etching of GaCrN using Inductively Coupled Cl2/Ar Chemistry T Patil, N Pande, R Adari, P Suggisetti, S Subramanian, S Ganguly, ... | | |