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Nakul Pande
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An Energy-Efficient One-Shot Time-Based Neural Network Accelerator Employing Dynamic Threshold Error Correction in 65 nm
LR Everson, M Liu, N Pande, CH Kim
IEEE Journal of Solid-State Circuits 54 (10), 2777-2785, 2019
322019
A non-volatile near-memory read mapping accelerator
SK Khatamifard, ZI Chowdhury, N Pande, M Razaviyayn, CH Kim, ...
arXiv preprint arXiv:1709.02381, 2017
182017
GeNVoM: Read mapping near non-volatile memory
SK Khatamifard, Z Chowdhury, N Pande, M Razaviyayn, C Kim, ...
IEEE/ACM Transactions on Computational Biology and Bioinformatics 19 (6 …, 2021
142021
A 104.8 TOPS/W One-Shot Time-Based Neuromorphic Chip Employing Dynamic Threshold Error Correction in 65nm
LR Everson, M Liu, N Pande, CH Kim
2018 IEEE Asian Solid-State Circuits Conference (A-SSCC), 273-276, 2018
142018
Read Mapping Near Non-Volatile Memory
SK Khatamifard, Z Chowdhury, N Pande, M Razaviyayn, C Kim, ...
arXiv preprint arXiv:1709.02381, 2017
132017
Characterizing Electromigration Effects in a 16nm FinFET Process Using a Circuit Based Test Vehicle
N Pande, C Zhou, MH Lin, R Fung, R Wong, S Wen, CH Kim
2019 IEEE International Electron Devices Meeting (IEDM), 5.3. 1-5.3. 4, 2019
122019
Understanding the Key Parameter Dependences Influencing the Soft-Error Susceptibility of Standard Combinational Logic
N Pande, S Kumar, LR Everson, CH Kim
IEEE Transactions on Nuclear Science 67 (1), 116-125, 2019
102019
Understanding the Key Parameter Dependencies Influencing the Soft-Error Susceptibility of Standard Combinational Logic
N Pande, S Kumar, LR Everson, CH Kim
2019 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2019
102019
Room temperature ferromagnetism in thermally diffused Cr in GaN
P Suggisetti, D Banerjee, R Adari, N Pande, T Patil, S Ganguly, D Saha
AIP Advances 3 (3), 2013
92013
Investigating the Aging Dynamics of Diode-connected MOS Devices using an Array-based Characterization Vehicle in a 65nm Process
N Pande, G Park, CH Kim, S Krishnan, V Reddy
2019 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2019
72019
A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing
G Park, M Kim, N Pande, PW Chiu, J Song, CH Kim
2019 IEEE Custom Integrated Circuits Conference (CICC), 1-4, 2019
42019
On-chip Heater Design and Control Methodology for Reliability Testing Applications Requiring over 300C Local Temperatures
H Yu, Y Yi, N Pande, CH Kim
IEEE Transactions on Device and Materials Reliability, 2023
32023
Electromigration-Induced Bit-Error-Rate Degradation of Interconnect Signal Paths Characterized from a 16nm Test Chip
N Pande, C Zhou, MH Lin, R Fung, R Wong, S Wen, CH Kim
2021 Symposium on VLSI Technology, 1-2, 2021
32021
A 16nm All-Digital Hardware Monitor for Evaluating Electromigration Effects in Signal Interconnects Through Bit-Error-Rate Tracking
N Pande, C Zhou, MH Lin, R Fung, R Wong, SJ Wen, CH Kim
IEEE Transactions on Device and Materials Reliability 22 (2), 194-204, 2022
22022
Neutron-Induced Pulse Width Distribution of Logic Gates Characterized Using a Pulse Shrinking Chain Based Test Structure
N Pande, S Kumar, LR Everson, G Park, I Ahmed, CH Kim
IEEE Transactions on Nuclear Science, 2021
22021
Array-Based On-Chip Hardware Monitors for Statistically Efficient Integrated Circuit Reliability Characterization
N Pande
University of Minnesota, 2020
2020
Neutron-Induced Pulse Width Distribution of Logic Gates Characterized Using a Pulse Shrinking Chain Based Test Structure
N Pande, S Kumar, LR Everson, G Park, I Ahmed, CH Kim
IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2020
2020
Large excitonic binding energy in GaN based superluminescent light emitting diode on naturally survived sub-10 nm lateral nanowires
D Banerjee, MB Nadar, P Upadhyay, R Singla, S Sankaranarayanan, ...
arXiv preprint arXiv:1503.02279, 2015
2015
Dry Etching of GaCrN using Inductively Coupled Cl2/Ar Chemistry
T Patil, N Pande, R Adari, P Suggisetti, S Subramanian, S Ganguly, ...
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