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Yangyang Lai
Yangyang Lai
Intel Corporation, Binghamton University
在 binghamton.edu 的电子邮件经过验证
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引用次数
引用次数
年份
An intelligent system for reflow oven temperature settings based on hybrid physics-machine learning model
Y Lai, K Pan, Y Cen, J Yang, C Cai, P Yin, S Park
Soldering & Surface Mount Technology 34 (5), 266-276, 2022
322022
Investigation of copper and glass interaction in through glass via (TGV) during thermal cycling
K Pan, J Xu, Y Lai, S Park, C Okoro, D Joshi, S Pollard
2021 IEEE 71st Electronic Components and Technology Conference (ECTC), 1660-1666, 2021
242021
Determination of Smarter Reflow Profile to Achieve Uniform Temperature throughout a Board
Y Lai
State University of New York at Binghamton. In PROQUESTMS Dissertations …, 2021
232021
Determination of Smarter Reflow Profile to Achieve a Uniform Temperature Throughout a Board
Y Lai, K Pan, J Xu, J Yang, S Park
2021 20th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2021
232021
Smarter temperature setup for reflow oven to minimize temperature variation among components
Y Lai, K Pan, C Cai, P Yin, J Yang, S Park
IEEE Transactions on Components, Packaging and Manufacturing Technology 12 …, 2022
212022
A comparison study of TIM degradation of phase change material and thermal grease
J Yang, Y Lai, K Pan, J Xu, T Mikjaniec, S Cain, S Park
2021 IEEE 71st Electronic Components and Technology Conference (ECTC), 1978-1983, 2021
212021
In-situ temperature-dependent characterization of copper through glass via (TGV)
K Pan, J Xu, Y Lai, S Park, C Okoro, D Joshi, S Pollard
Microelectronics Reliability 129, 114487, 2022
162022
Reflow recipe establishment based on CFD-Informed machine learning model
Y Lai, JH Ha, KA Deo, J Yang, P Yin, S Park
IEEE Transactions on Components, Packaging and Manufacturing Technology 13 …, 2023
132023
A comparative study of the thermomechanical reliability of fully-filled and conformal through-glass via
K Pan, C Okoro, Y Lai, D Joshi, S Park, S Pollard
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC), 1211-1217, 2022
132022
Shape dependency of fatigue life in solder joints of chip resistors
J Ha, C Cai, P Yin, Y Lai, K Pan, J Yang, S Park
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC), 1489-1494, 2022
132022
A deep learning approach for reflow profile prediction
Y Lai, J Kataoka, K Pan, J Ha, J Yang, KA Deo, J Xu, P Yin, C Cai, S Park
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC), 2269-2274, 2022
122022
Thermomechanical reliability of BGA packages with different underfill reinforcement methods
Y Lai, C Cai, K Pan, J Yang, J Ha, P Yin, K Deo, S Park
International Electronic Packaging Technical Conference and Exhibition 86557 …, 2022
112022
The optimal solution of reflow oven recipe based on physics-guided machine learning model
Y Lai, K Pan, J Ha, C Cai, J Yang, P Yin, J Xu, S Park
2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical …, 2022
112022
Optimal thermo-mechanical reliability design of 2.5 D lidless package
J Yang, C Cai, P Yin, K Pan, Y Lai, J Wang, S Park
2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical …, 2022
112022
A study on parameters that impact the thermal fatigue life of BGA solder joints
K Arun Deo, RN Kono, C Cai, J Yang, Y Lai, S Park
International Electronic Packaging Technical Conference and Exhibition 86557 …, 2022
102022
Parametric study of the geometry design of through-silicon via in silicon interposer
K Pan, Y Lai, J Xu, P Yin, J Ha, C Cai, J Yang, S Park
2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical …, 2022
102022
Effect of Differently Shaped Solder Joints of Chip Resistor on Fatigue Life
J Ha, Y Lai, J Yang, P Yin, S Park
Journal of Electronic Packaging 146 (2), 2024
52024
Characterization of constitutive equation of Sn-Bi by studying creep behavior of flip chip solder joints
C Cai, K Pan, K Deo, Y Lai, J Yang, J Wang, S Park
2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical …, 2022
52022
Reflow profiling with the aid of machine learning models
Y Lai, S Park
Soldering & Surface Mount Technology, 2023
42023
Enhanced solder fatigue life of chip resistor by optimizing solder shape
J Ha, Y Lai, J Yang, P Yin, S Park
Microelectronics Reliability 145, 114994, 2023
42023
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