| The common language of speech perception and action: a neurocognitive perspective JL Schwartz, M Sato, L Fadiga Revue française de linguistique appliquée 13 (2), 9-22, 2008 | 32 | 2008 |
| Analytic estimation of thermal resistance in HBTs A Chakravorty, R D’Esposito, S Balanethiram, S Frégonèse, T Zimmer IEEE Transactions on Electron Devices 63 (8), 2994-2998, 2016 | 23 | 2016 |
| Extracting the temperature dependence of thermal resistance from temperature-controlled DC measurements of sige HBTs S Balanethiram, R d'Esposito, S Fregonese, T Zimmer, J Berkner, D Celi 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 94-97, 2017 | 21 | 2017 |
| Accurate modeling of thermal resistance for on-wafer SiGe HBTs using average thermal conductivity S Balanethiram, A Chakravorty, R D’Esposito, S Fregonese, D Céli, ... IEEE Transactions on Electron Devices 64 (9), 3955-3960, 2017 | 20 | 2017 |
| Thermal penetration depth analysis and impact of the BEOL metals on the thermal impedance of SiGe HBTs R D’Esposito, S Balanethiram, JL Battaglia, S Frégonèse, T Zimmer IEEE Electron Device Letters 38 (10), 1457-1460, 2017 | 19 | 2017 |
| Extraction of BEOL contributions for thermal resistance in SiGe HBTs S Balanethiram, R D’Esposito, A Chakravorty, S Fregonese, T Zimmer IEEE Transactions on Electron Devices 64 (3), 1380-1384, 2017 | 14 | 2017 |
| An improved scalable self-consistent iterative model for thermal resistance in SiGe HBTs S Balanethiram, A Chakravorty, R D'Esposito, S Fregonese, T Zimmer 2016 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 150-153, 2016 | 10 | 2016 |
| One-shot face recognition KV Kumar, KA Teja, RT Bhargav, V Satpute, C Naveen, V Kamble 2023 2nd International Conference on Paradigm Shifts in Communications …, 2023 | 6 | 2023 |
| Validation of thermal resistance extracted from measurements on stripe geometry SiGe HBTs S Balanethiram, R D’Esposito, S Fregonese, A Chakravorty, T Zimmer IEEE Transactions on Electron Devices 66 (10), 4151-4155, 2019 | 6 | 2019 |
| An efficient thermal model for multifinger SiGe HBTs under real operating condition K Nidhin, S Pande, S Yadav, S Balanethiram, DR Nair, S Fregonese, ... IEEE Transactions on Electron Devices 67 (11), 5069-5075, 2020 | 5 | 2020 |
| Influence of the BEOL metallization design on the overall performances of SiGe HBTs R D'Esposito, M De Matos, S Fregonese, S Balanethiram, A Chakravorty, ... 2016 13th IEEE International Conference on Solid-State and Integrated …, 2016 | 5 | 2016 |
| Efficient modeling of distributed dynamic self-heating and thermal coupling in multifinger SiGe HBTs S Balanethiram, R D’Esposito, A Chakravorty, S Fregonese, D Céli, ... IEEE Transactions on Electron Devices 63 (9), 3393-3398, 2016 | 5 | 2016 |
| Efficient modeling of static self-heating and thermal-coupling in multi-finger SiGe HBTs S Balanethiram, A Chakravorty, R d'Esposito, S Fregonese, T Zimmer 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting-BCTM, 68-71, 2015 | 5 | 2015 |
| Static thermal coupling factors in multi-finger bipolar transistors: Part I—model development A Gupta, K Nidhin, S Balanethiram, S Yadav, A Chakravorty, S Fregonese, ... Electronics 9 (9), 1333, 2020 | 4 | 2020 |
| Extraction of true finger temperature from measured data in multifinger bipolar transistors A Gupta, K Nidhin, S Balanethiram, R D’Esposito, S Fregonese, T Zimmer, ... IEEE Transactions on Electron Devices 68 (3), 1385-1388, 2021 | 3 | 2021 |
| Static thermal coupling factors in multi-finger bipolar transistors: Part II-experimental validation A Gupta, K Nidhin, S Balanethiram, S Yadav, A Chakravorty, S Fregonese, ... Electronics 9 (9), 1365, 2020 | 3 | 2020 |
| Device level analysis of threshold voltage variation in FinFET with varied design parameters DJ Moni, R Malarkodi, B Suresh 2011 International Conference on Computer, Communication and Electrical …, 2011 | 3 | 2011 |
| A physics-based compact model of thermal resistance in RRAMs S Pande, S Balanethiram, B Chakrabarti, A Chakravorty Solid-State Electronics 204, 108636, 2023 | 2 | 2023 |
| Development of low-cost silicon bicmos technology for rf applications S Balanethiram, S Pande, AK Singh, B Umapathi, HS Jatana, ... 2019 IEEE Conference on Modeling of Systems Circuits and Devices (MOS-AK …, 2019 | 2 | 2019 |
| Extracting the FEOL and BEOL components of thermal resistance in SiGe HBTs S Balanethiram, A Chakravorty, R D'Esposito, S Fregonese, T Zimmer 2016 3rd International Conference on Emerging Electronics (ICEE), 1-4, 2016 | 2 | 2016 |
Anjan ChakravortyAssociate Professor of Electrical Engineering, IIT Madras在 ee.iitm.ac.in 的电子邮件经过验证
