Validation of a quantized-current source with 0.2 ppm uncertainty F Stein, D Drung, L Fricke, H Scherer, F Hohls, C Leicht, M Götz, C Krause, ... Applied Physics Letters 107 (10), 2015 | 97 | 2015 |
Ultrastable low-noise current amplifier: A novel device for measuring small electric currents with high accuracy D Drung, C Krause, U Becker, H Scherer, FJ Ahlers Review of Scientific Instruments 86 (2), 2015 | 94 | 2015 |
Quantum metrology triangle experiments: a status review H Scherer, B Camarota Measurement Science and Technology 23 (12), 124010, 2012 | 88 | 2012 |
Precision measurement of the quantized anomalous Hall resistance at zero magnetic field M Götz, KM Fijalkowski, E Pesel, M Hartl, S Schreyeck, M Winnerlein, ... Applied Physics Letters 112 (7), 2018 | 81 | 2018 |
Robustness of single-electron pumps at sub-ppm current accuracy level F Stein, H Scherer, T Gerster, R Behr, M Götz, E Pesel, C Leicht, ... Metrologia 54 (1), S1, 2016 | 78 | 2016 |
Improving the traceable measurement and generation of small direct currents D Drung, M Götz, E Pesel, H Scherer IEEE transactions on instrumentation and measurement 64 (11), 3021-3030, 2015 | 67 | 2015 |
Improved cryogenic current comparator setup with digital current sources M Gotz, D Drung, E Pesel, HJ Barthelmess, C Hinnrichs, C Aßmann, ... IEEE Transactions on Instrumentation and Measurement 58 (4), 1176-1182, 2009 | 54 | 2009 |
Single-charge devices with ultrasmall Nb∕ AlOx∕ Nb trilayer Josephson junctions R Dolata, H Scherer, AB Zorin, J Niemeyer Journal of Applied Physics 97 (5), 2005 | 49 | 2005 |
Electron counting capacitance standard with an improved five-junction R-pump B Camarota, H Scherer, MW Keller, SV Lotkhov, GD Willenberg, FJ Ahlers Metrologia 49 (1), 8, 2011 | 41 | 2011 |
Validation of the ultrastable low-noise current amplifier as travelling standard for small direct currents D Drung, C Krause, SP Giblin, S Djordjevic, F Piquemal, O Séron, ... Metrologia 52 (6), 756, 2015 | 34 | 2015 |
Single‐Electron Pumps and Quantum Current Metrology in the Revised SI H Scherer, HW Schumacher Annalen der Physik 531 (5), 1800371, 2019 | 33 | 2019 |
Bistability in the current-induced breakdown of the quantum Hall effect FJ Ahlers, G Hein, H Scherer, L Bilek, H Nickel, R Losch, W Schlapp Semiconductor science and technology 8 (12), 2062, 1993 | 31 | 1993 |
Single electron transistors with high-quality superconducting niobium islands R Dolata, H Scherer, AB Zorin, J Niemeyer Applied physics letters 80 (15), 2776-2778, 2002 | 30 | 2002 |
Measurement of sub-picoampere direct currents with uncertainties below ten attoamperes C Krause, D Drung, H Scherer Review of Scientific Instruments 88 (2), 2017 | 28 | 2017 |
Multilayer technique for fabricating Nb junction circuits exhibiting charging effects AB Pavolotsky, T Weimann, H Scherer, VA Krupenin, J Niemeyer, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999 | 25 | 1999 |
Single electron transistors with junctions R Dolata, H Scherer, AB Zorin, J Niemeyer Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003 | 24 | 2003 |
Current scaling and electron heating between integer quantum Hall plateaus in GaAs/AlxGa1-xAs heterostructures H Scherer, L Schweitzer, FJ Ahlers, L Bliek, R Losch, W Schlapp Semiconductor science and technology 10 (7), 959, 1995 | 23 | 1995 |
Characterization of all-chromium tunnel junctions and single-electron tunneling devices fabricated by direct-writing multilayer technique H Scherer, T Weimann, P Hinze, BW Samwer, AB Zorin, J Niemeyer Journal of Applied Physics 86 (12), 6956-6964, 1999 | 21 | 1999 |
Steps toward a capacitance standard based on single-electron counting at PTB H Scherer, SV Lotkhov, GD Willenberg, AB Zorin IEEE transactions on instrumentation and measurement 54 (2), 666-669, 2005 | 19 | 2005 |
The effect of thermal annealing on the properties of Al–AlOx–Al single electron tunneling transistors H Scherer, T Weimann, AB Zorin, J Niemeyer Journal of Applied Physics 90 (5), 2528-2532, 2001 | 19 | 2001 |