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Minsik Oh
Minsik Oh
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology
在 mit.edu 的电子邮件经过验证
标题
引用次数
引用次数
年份
Enhanced Ferroelectric Properties in Hf0.5Zr0.5O2 Films Using a HfO0.61N0.72 Interfacial Layer
BY Kim, HW Park, SD Hyun, YB Lee, SH Lee, M Oh, SK Ryoo, IS Lee, ...
Advanced Electronic Materials 8 (6), 2100042, 2022
362022
Polarizing and depolarizing charge injection through a thin dielectric layer in a ferroelectric–dielectric bilayer
HW Park, SD Hyun, IS Lee, SH Lee, YB Lee, M Oh, BY Kim, SG Ryoo, ...
Nanoscale 13 (4), 2556-2572, 2021
302021
Oxygen‐Scavenging Effects of Added Ti Layer in the TiN Gate of Metal‐Ferroelectric‐Insulator‐Semiconductor Capacitor with Al‐Doped HfO2 Ferroelectric Film
YB Lee, BY Kim, HW Park, SH Lee, M Oh, SK Ryoo, IS Lee, S Byun, ...
Advanced Electronic Materials 8 (11), 2200310, 2022
182022
Enhancement-Mode GaN Transistor Technology for Harsh Environment Operation
M Yuan, J Niroula, Q Xie, NS Rajput, K Fu, S Luo, SK Das, AJB Iqbal, ...
IEEE Electron Device Letters, 2023
112023
Negative Capacitance from the Inhomogenous Stray Field in a Ferroelectric–Dielectric Structure
HW Park, M Oh, CS Hwang
Advanced Functional Materials 32 (19), 2200389, 2022
112022
Improved ferroelectricity in Hf0. 5Zr0. 5O2 by inserting an upper HfOxNy interfacial layer
BY Kim, SH Kim, HW Park, YB Lee, SH Lee, M Oh, SK Ryoo, IS Lee, ...
Applied Physics Letters 119 (12), 2021
92021
Top Electrode Engineering for High‐Performance Ferroelectric Hf0.5Zr0.5O2 Capacitors
BY Kim, IS Lee, HW Park, YB Lee, SH Lee, M Oh, SK Ryoo, SR Byun, ...
Advanced Materials Technologies 8 (16), 2300146, 2023
52023
Double S‐Shaped Polarization – Voltage Curve and Negative Capacitance from Al2O3‐Hf0.5Zr0.5O2‐Al2O3 Triple‐Layer Structure
HW Park, M Oh, IS Lee, S Byun, YH Jang, YB Lee, BY Kim, SH Lee, ...
Advanced Functional Materials 33 (9), 2206637, 2023
42023
Atomic layer deposition of HfN x films and improving the film performance by annealing under NH 3 atmosphere
SK Ryoo, BY Kim, YB Lee, HW Park, SH Lee, M Oh, IS Lee, SY Byun, ...
Journal of Materials Chemistry C 11 (24), 8018-8026, 2023
22023
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