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Agnieszka Priebe
Agnieszka Priebe
在 empa.ch 的电子邮件经过验证
标题
引用次数
引用次数
年份
Proceedings of the 11th European Particle Accelerator Conference, Genoa, 2008
EB Holzer, D Bocian, TT Böhlen, B Dehning, D Kramer, L Ponce, A Priebe, ...
EPS-AG, 2008
2582008
Building a better Li‐garnet solid electrolyte/metallic Li interface with antimony
R Dubey, J Sastre, C Cancellieri, F Okur, A Forster, L Pompizii, A Priebe, ...
Advanced Energy Materials 11 (39), 2102086, 2021
872021
Lithium Garnet Li7La3Zr2O12 Electrolyte for All‐Solid‐State Batteries: Closing the Gap between Bulk and Thin Film Li‐Ion Conductivities
J Sastre, A Priebe, M Döbeli, J Michler, AN Tiwari, YE Romanyuk
Advanced Materials Interfaces 7 (17), 2000425, 2020
872020
Testing beam-induced quench levels of LHC superconducting magnets
B Auchmann, T Baer, M Bednarek, G Bellodi, C Bracco, R Bruce, F Cerutti, ...
Physical Review Special Topics-Accelerators and Beams 18 (6), 061002, 2015
812015
Blocking lithium dendrite growth in solid-state batteries with an ultrathin amorphous Li-La-Zr-O solid electrolyte
J Sastre, MH Futscher, L Pompizi, A Aribia, A Priebe, J Overbeck, ...
Communications Materials 2 (1), 76, 2021
662021
The matrix effect in TOF-SIMS analysis of two-element inorganic thin films
A Priebe, T Xie, G Bürki, L Pethö, J Michler
Journal of Analytical Atomic Spectrometry 35 (6), 1156-1166, 2020
552020
Aluminum-assisted densification of cosputtered lithium garnet electrolyte films for solid-state batteries
J Sastre, TY Lin, AN Filippin, A Priebe, E Avancini, J Michler, AN Tiwari, ...
ACS Applied Energy Materials 2 (12), 8511-8524, 2019
542019
Application of a gas-injection system during the FIB-TOF-SIMS analysis—Influence of water vapor and fluorine gas on secondary ion signals and sputtering rates
A Priebe, I Utke, L Petho, J Michler
Analytical chemistry 91 (18), 11712-11722, 2019
352019
Voids and compositional inhomogeneities in Cu(In,Ga)Se2 thin films: evolution during growth and impact on solar cell performance
A Enrico, D Keller, R Carron, YAR Dasilva, R Erni, A Priebe, SD Napoli, ...
Science and Technology of Advanced Materials 19, 871–882, 2018
312018
3D imaging of nanoparticles in an inorganic matrix using TOF-SIMS validated with STEM and EDX
A Priebe, JP Barnes, TEJ Edwards, L Pethö, I Balogh, J Michler
Analytical chemistry 91 (18), 11834-11839, 2019
282019
Elemental characterization of Al nanoparticles buried under a Cu thin film: TOF-SIMS vs STEM/EDX
A Priebe, JP Barnes, TEJ Edwards, E Huszár, L Pethö, J Michler
Analytical chemistry 92 (18), 12518-12527, 2020
272020
Fluorine gas coinjection as a solution for enhancing spatial resolution of time-of-flight secondary ion mass spectrometry and separating mass interference
A Priebe, L Pethö, J Michler
Analytical chemistry 92 (2), 2121-2129, 2019
222019
Unlocking stable multi‐electron cycling in NMC811 thin‐films between 1.5–4.7 V
A Aribia, J Sastre, X Chen, MH Futscher, M Rumpel, A Priebe, M Döbeli, ...
Advanced Energy Materials 12 (40), 2201750, 2022
212022
A novel PFIB sample preparation protocol for correlative 3D X-ray CNT and FIB-TOF-SIMS tomography
A Priebe, G Audoit, JP Barnes
Ultramicroscopy 173, 10-13, 2017
202017
3D correlative morphological and elemental characterization of materials at the deep submicrometre scale
A Priebe, G Goret, P Bleuet, G Audoit, J Laurencin, JP BARNES
Journal of Microscopy 264 (2), 247-251, 2016
162016
High sensitivity of fluorine gas-assisted FIB-TOF-SIMS for chemical characterization of buried sublayers in thin films
A Priebe, L Petho, E Huszar, T Xie, I Utke, J Michler
ACS Applied Materials & Interfaces 13 (13), 15890-15900, 2021
152021
Beam induced quenches of LHC magnets
M Sapinski, S Redaelli, R Schmidt, M Bednarek, A Priebe, D Valuch, ...
152013
State-of-the-Art Three-Dimensional Chemical Characterization of Solid Oxide Fuel Cell Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Tomography
A Priebe, P Bleuet, G Goret, J Laurencin, D Montinaro, JP Barnes
Microscopy and Microanalysis 22 (6), 1261-1269, 2016
142016
Collimator losses in the DS of IR7 and quench test at 3.5~ TeV
RW Assmann, EB Holzer, S Redaelli, G Valentino, D Deboy, J Wenninger, ...
142011
Practical aspects of focused ion beam time-of-flight secondary ion mass spectrometry analysis enhanced by fluorine gas coinjection
K Wieczerzak, A Priebe, I Utke, J Michler
Chemistry of Materials 33 (5), 1581-1593, 2021
132021
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