| Impact of variability on processor performance in negative capacitance finfet technology H Amrouch, G Pahwa, AD Gaidhane, CK Dabhi, F Klemme, O Prakash, ... IEEE Transactions on Circuits and Systems I: Regular Papers 67 (9), 3127-3137, 2020 | 61 | 2020 |
| Impact of extrinsic variation sources on the device-to-device variation in ferroelectric FET K Ni, A Gupta, O Prakash, S Thomann, XS Hu, H Amrouch 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 53 | 2020 |
| Temperature dependence and temperature-aware sensing in ferroelectric FET A Gupta, K Ni, O Prakash, XS Hu, H Amrouch 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 39 | 2020 |
| On the channel percolation in ferroelectric FET towards proper analog states engineering K Ni, S Thomann, O Prakash, Z Zhao, S Deng, H Amrouch 2021 IEEE International Electron Devices Meeting (IEDM), 15.3. 1-15.3. 4, 2021 | 36 | 2021 |
| Impact of interface traps on negative capacitance transistor: Device and circuit reliability O Prakash, A Gupta, G Pahwa, J Henkel, YS Chauhan, H Amrouch IEEE Journal of the Electron Devices Society 8, 1193-1201, 2020 | 36 | 2020 |
| Transistor self-heating: The rising challenge for semiconductor testing O Prakash, CK Dabhi, YS Chauhan, H Amrouch 2021 IEEE 39th VLSI Test Symposium (VTS), 1-7, 2021 | 27 | 2021 |
| Impact of self-heating on negative-capacitance finfet: Device-circuit interaction O Prakash, G Pahwa, CK Dabhi, YS Chauhan, H Amrouch IEEE Transactions on Electron Devices 68 (4), 1420-1424, 2021 | 23 | 2021 |
| On the reliability of in-memory computing: Impact of temperature on ferroelectric TCAM S Thomann, C Li, C Zhuo, O Prakash, X Yin, XS Hu, H Amrouch 2021 IEEE 39th VLSI Test Symposium (VTS), 1-6, 2021 | 21 | 2021 |
| Compact NBTI reliability modeling in Si nanowire MOSFETs and effect in circuits O Prakash, S Beniwal, S Maheshwaram, A Bulusu, N Singh, SK Manhas IEEE Transactions on Device and Materials Reliability 17 (2), 404-413, 2017 | 21 | 2017 |
| Reliability challenges with self-heating and aging in finfet technology H Amrouch, VM van Santen, O Prakash, H Kattan, S Salamin, S Thomann, ... 2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019 | 19 | 2019 |
| Performance optimization of analog circuits in negative capacitance transistor technology O Prakash, N Chauhan, A Gupta, H Amrouch Microelectronics Journal 115, 105193, 2021 | 15 | 2021 |
| Traps based reliability barrier on performance and revealing early ageing in negative capacitance FET A Gupta, G Bajpai, P Singhal, N Bagga, O Prakash, S Banchhor, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021 | 12 | 2021 |
| Impact of NBTI aging on self-heating in nanowire FET O Prakash, H Amrouch, S Manhas, J Henkel 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2020 | 12 | 2020 |
| Cleaved-gate ferroelectric FET for reliable multi-level cell storage N Bagga, K Ni, N Chauhan, O Prakash, XS Hu, H Amrouch 2022 IEEE International Reliability Physics Symposium (IRPS), P5-1-P5-5, 2022 | 11 | 2022 |
| Impact of radiation on negative capacitance finfet G Bajpai, A Gupta, O Prakash, G Pahwa, J Henkel, YS Chauhan, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 10 | 2020 |
| Impact of interface traps induced degradation on negative capacitance FinFET O Prakash, A Gupta, G Pahwa, J Henkel, YS Chauhan, H Amrouch 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-4, 2020 | 10 | 2020 |
| Compact model for vertical silicon nanowire based device simulation and circuit design M Sharma, S Maheshwaram, O Prakash, A Bulusu, AK Saxena, ... 2015 International SoC Design Conference (ISOCC), 107-108, 2015 | 10 | 2015 |
| Impact of self-heating on performance, power and reliability in finfet technology VM van Santen, PR Genssler, O Prakash, S Thomann, J Henkel, ... 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 68-73, 2020 | 9 | 2020 |
| Performance and variability analysis of SiNW 6T-SRAM cell using compact model with parasitics O Prakash, S Maheshwaram, M Sharma, A Bulusu, SK Manhas IEEE Transactions on Nanotechnology 16 (6), 965-973, 2017 | 9 | 2017 |
| Variability Effects in FinFET Transistors and Emerging NC-FinFET A Gupta, N Chauhan, O Prakash, H Amrouch 2021 International Conference on IC Design and Technology (ICICDT), 1-4, 2021 | 8 | 2021 |
Bulusu AnandIndian Institute of Technology Roorkee在 ece.iitr.ac.in 的电子邮件经过验证
Bulusu AnandIndian Institute of Technology Roorkee在 ece.iitr.ac.in 的电子邮件经过验证