| Modern theory and applications of photocathodes WE Spicer, A Herrera-Gomez Photodetectors and Power Meters 2022, 18-35, 1993 | 332 | 1993 |
| Practical methods for background subtraction in photoemission spectra A Herrera‐Gomez, M Bravo‐Sanchez, O Ceballos‐Sanchez, ... Surface and Interface Analysis 46 (10-11), 897-905, 2014 | 175 | 2014 |
| Accurate peak fitting and subsequent quantitative composition analysis of the spectrum of Co 2p obtained with Al Kα radiation: I: cobalt spinel D Cabrera‐German, G Gomez‐Sosa, A Herrera‐Gomez Surface and Interface Analysis 48 (5), 252-256, 2016 | 135 | 2016 |
| Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy analyses in the scientific literature GH Major, TG Avval, B Moeini, G Pinto, D Shah, V Jain, V Carver, ... Journal of Vacuum Science & Technology A 38 (6), 2020 | 123 | 2020 |
| Magnetic properties of magnetite nanoparticles synthesized by forced hydrolysis ME Compeán-Jasso, F Ruiz, JR Martínez, A Herrera-Gomez Materials Letters 62 (27), 4248-4250, 2008 | 97 | 2008 |
| Chemical depth profile of ultrathin nitrided films A Herrera-Gómez, A Hegedus, PL Meissner Applied physics letters 81 (6), 1014-1016, 2002 | 94 | 2002 |
| Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities MH Engelhard, DR Baer, A Herrera-Gomez, P Sherwood Journal of Vacuum Science & Technology A 38 (6), 2020 | 93 | 2020 |
| Identification of bound water through infrared spectroscopy in methylcellulose G Velazquez, A Herrera-Gómez, MO Martı́n-Polo Journal of Food Engineering 59 (1), 79-84, 2003 | 89 | 2003 |
| Uniqueness plots: A simple graphical tool for identifying poor peak fits in X-ray photoelectron spectroscopy B Singh, A Diwan, V Jain, A Herrera-Gomez, J Terry, MR Linford Applied Surface Science 387, 155-162, 2016 | 71 | 2016 |
| Photocatalytic degradation of 2, 4-dichlorophenoxyacetic acid under visible light: effect of synthesis route K Del Ángel-Sanchez, O Vázquez-Cuchillo, A Aguilar-Elguezabal, ... Materials chemistry and physics 139 (2-3), 423-430, 2013 | 65 | 2013 |
| The slope-background for the near-peak regimen of photoemission spectra A Herrera-Gomez, M Bravo-Sanchez, FS Aguirre-Tostado, ... Journal of Electron Spectroscopy and Related Phenomena 189, 76-80, 2013 | 62 | 2013 |
| Proliferation of faulty materials data analysis in the literature MR Linford, VS Smentkowski, JT Grant, CR Brundle, PMA Sherwood, ... Microscopy and Microanalysis 26 (1), 1-2, 2020 | 60 | 2020 |
| Composition assessment of ferric oxide by accurate peak fitting of the Fe 2p photoemission spectrum M Bravo Sanchez, JA Huerta‐Ruelas, D Cabrera‐German, ... Surface and Interface Analysis 49 (4), 253-260, 2017 | 55 | 2017 |
| Photoemission from the Sr/Si (001) interface A Herrera-Gomez, FS Aguirre-Tostado, Y Sun, P Pianetta, Z Yu, ... Journal of Applied Physics 90 (12), 6070-6072, 2001 | 54 | 2001 |
| Analysis of the water bound to a polymer matrix by infrared spectroscopy A Herrera-Gómez, G Velázquez-Cruz, MO Martín-Polo Journal of Applied Physics 89 (10), 5431-5437, 2001 | 54 | 2001 |
| Resolving overlapping peaks in ARXPS data: the effect of noise and fitting method J Muñoz-Flores, A Herrera-Gomez Journal of Electron Spectroscopy and Related Phenomena 184 (11-12), 533-541, 2012 | 51 | 2012 |
| Report on the 47th IUVSTA Workshop ‘Angle‐Resolved XPS: the current status and future prospects for angle‐resolved XPS of nano and subnano films’ A Herrera‐Gomez, JT Grant, PJ Cumpson, M Jenko, FS Aguirre‐Tostado, ... Surface and Interface Analysis: An International Journal devoted to the …, 2009 | 50 | 2009 |
| Physics of high‐intensity nanosecond electron source: Charge limit phenomenon in GaAs photocathodes A Herrera‐Gómez, G Vergara, WE Spicer Journal of applied physics 79 (9), 7318-7323, 1996 | 48 | 1996 |
| Detailed peak fitting analysis of the Zn 2p photoemission spectrum for metallic films and its initial oxidation stages D Cabrera‐German, G Molar‐Velázquez, G Gómez‐Sosa, W De la Cruz, ... Surface and Interface Analysis 49 (11), 1078-1087, 2017 | 43 | 2017 |
| Instrument-related geometrical factors affecting the intensity in XPS and ARXPS experiments A Herrera-Gomez, FS Aguirre-Tostado, PG Mani-Gonzalez, ... Journal of Electron Spectroscopy and Related Phenomena 184 (8-10), 487-500, 2011 | 43 | 2011 |
Joseph WoicikNIST在 bnl.gov 的电子邮件经过验证
