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Mel Hainey,Jr
Mel Hainey,Jr
Tokyo Electron
在 tel.com 的电子邮件经过验证
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引用次数
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年份
Vertically aligned single-walled carbon nanotubes as low-cost and high electrocatalytic counter electrode for dye-sensitized solar cells
P Dong, CL Pint, M Hainey, F Mirri, Y Zhan, J Zhang, M Pasquali, ...
ACS applied materials & interfaces 3 (8), 3157-3161, 2011
1112011
Controlled synthesis of 2D transition metal dichalcogenides: from vertical to planar MoS2
F Zhang, K Momeni, MA AlSaud, A Azizi, MF Hainey, JM Redwing, ...
2D Materials 4 (2), 025029, 2017
822017
Near-field resonant photon sorting applied: dual-band metasurface quantum well infrared photodetectors for gas sensing
MF Hainey Jr, T Mano, T Kasaya, T Ochiai, H Osato, K Watanabe, ...
Nanophotonics 9 (16), 4775-4784, 2020
222020
Aluminum-catalyzed silicon nanowires: Growth methods, properties, and applications
MF Hainey, JM Redwing
Applied Physics Reviews 3 (4), 2016
202016
Systematic studies for improving device performance of quantum well infrared stripe photodetectors
MF Hainey Jr, T Mano, T Kasaya, T Ochiai, H Osato, K Watanabe, ...
Nanophotonics 9 (10), 3373-3384, 2020
142020
Epitaxial growth of SiGe on Si substrate by printing and firing of Al–Ge mixed paste
S Fukami, Y Nakagawa, MF Hainey, K Gotoh, Y Kurokawa, M Nakahara, ...
Japanese Journal of Applied Physics 58 (4), 045504, 2019
112019
Controlling silicon crystallization in aluminum-induced crystallization via substrate plasma treatment
MF Hainey, JL Innocent-Dolor, TH Choudhury, JM Redwing
Journal of Applied Physics 121 (11), 2017
112017
Controlled loading of nanoparticles into submicrometer holes
NA Mirin, M Hainey Jr, NJ Halas
Advanced Materials 20 (3), 535-538, 2008
112008
Patchwork metasurface quantum well photodetectors with broadened photoresponse
MF Hainey Jr, T Mano, T Kasaya, Y Jimba, H Miyazaki, T Ochiai, H Osato, ...
Optics Express 29 (1), 59-69, 2020
102020
Breaking the interband detectivity limit with metasurface multi-quantum-well infrared photodetectors
MF Hainey Jr, T Mano, T Kasaya, Y Jimba, H Miyazaki, T Ochiai, H Osato, ...
Optics Express 29 (26), 43598-43611, 2021
92021
Vapor-liquid-solid growth of< 110> silicon nanowire arrays
SM Eichfeld, MF Hainey Jr, H Shen, CE Kendrick, EA Fucinato, J Yim, ...
Nanoepitaxy: Materials and Devices V 8820, 24-29, 2013
92013
Heteroepitaxy of Highly Oriented GaN Films on Non‐Single Crystal Substrates Using a Si (111) Template Layer Formed by Aluminum‐Induced Crystallization
MF Hainey Jr, ZY Al Balushi, K Wang, NC Martin, A Bansal, M Chubarov, ...
physica status solidi (RRL)–Rapid Research Letters 12 (3), 1700392, 2018
72018
Aluminum-Catalyzed Growth of‹ 110› Silicon Nanowires
M Hainey, SM Eichfeld, H Shen, J Yim, MR Black, JM Redwing
Journal of Electronic Materials 44, 1332-1337, 2015
72015
Carrier gas effects on aluminum-catalyzed nanowire growth
Y Ke, M Hainey, D Won, X Weng, SM Eichfeld, JM Redwing
Nanotechnology 27 (13), 135605, 2016
62016
Pole figure analysis from electron backscatter diffraction—an effective method of evaluating fiber-textured silicon thin films as seed layers for epitaxy
M Hainey, Y Robin, H Amano, N Usami
Applied Physics Express 12 (2), 025501, 2019
52019
Controlled faceting and morphology for light trapping in aluminum-catalyzed silicon nanostructures
MF Hainey Jr, C Chen, Y Ke, MR Black, JM Redwing
Journal of Crystal Growth 452, 248-252, 2016
52016
Scalable fabrication of GaN on amorphous substrates via MOCVD on highly oriented silicon seed layers
M Hainey Jr, Y Robin, G Avit, H Amano, N Usami
Journal of Crystal Growth 535, 125522, 2020
22020
Surface-orientation control of silicon thin films via aluminum-induced crystallization on monocrystalline cubic substrates
M Hainey Jr, EC Zhou, L Viguerie, N Usami
Journal of Crystal Growth 533, 125441, 2020
22020
Aluminum-Catalyzed Growth of Silicon Nanowires in High-Energy Growth Directions
MF Hainey Jr, X Zhang, K Wang, JM Redwing
ACS Applied Nano Materials 1 (10), 5493-5499, 2018
22018
Study on Chemical Vapor Deposition Growth and Transmission electron Microscopy MoS2/h-BN Heterostructure
F Zhang, MA AlSaud, M Hainey Jr, K Wang, JM Redwing, N Alem
Microscopy and Microanalysis 22 (S3), 1640-1641, 2016
22016
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