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Manabu Kano
Manabu Kano
Department of Systems Science, Graduate School of Informatics, Kyoto University
在 human.sys.i.kyoto-u.ac.jp 的电子邮件经过验证 - 首页
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引用次数
引用次数
年份
Data-based process monitoring, process control, and quality improvement: Recent developments and applications in steel industry
M Kano, Y Nakagawa
Computers & Chemical Engineering 32 (1-2), 12-24, 2008
5692008
Monitoring independent components for fault detection
M Kano, S Tanaka, S Hasebe, I Hashimoto, H Ohno
AIChE Journal 49 (4), 969-976, 2003
5192003
Soft‐sensor development using correlation‐based just‐in‐time modeling
K Fujiwara, M Kano, S Hasebe, A Takinami
AIChE Journal 55 (7), 1754-1765, 2009
3502009
A new multivariate statistical process monitoring method using principal component analysis
M Kano, S Hasebe, I Hashimoto, H Ohno
Computers & chemical engineering 25 (7-8), 1103-1113, 2001
3302001
The state of the art in chemical process control in Japan: Good practice and questionnaire survey
M Kano, M Ogawa
Journal of Process control 20 (9), 969-982, 2010
3232010
Biodiesel production from palm oil, its by-products, and mill effluent: A review
KA Zahan, M Kano
Energies 11 (8), 2132, 2018
3012018
Comparison of multivariate statistical process monitoring methods with applications to the Eastman challenge problem
M Kano, K Nagao, S Hasebe, I Hashimoto, H Ohno, R Strauss, BR Bakshi
Computers & chemical engineering 26 (2), 161-174, 2002
2652002
CFD-based optimal design of manifold in plate-fin microdevices
O Tonomura, S Tanaka, M Noda, M Kano, S Hasebe, I Hashimoto
Chemical Engineering Journal 101 (1-3), 397-402, 2004
2622004
Practical model and detection algorithm for valve stiction
M Kano, H Maruta, H Kugemoto, K Shimizu
IFAC Proceedings Volumes 37 (9), 859-864, 2004
2452004
Inferential control system of distillation compositions using dynamic partial least squares regression
M Kano, K Miyazaki, S Hasebe, I Hashimoto
Journal of process control 10 (2-3), 157-166, 2000
2362000
Heart rate variability-based driver drowsiness detection and its validation with EEG
K Fujiwara, E Abe, K Kamata, C Nakayama, Y Suzuki, T Yamakawa, ...
IEEE transactions on biomedical engineering 66 (6), 1769-1778, 2018
2172018
Virtual Sensing Technology in Process Industries: Trends and Challenges Revealed by Recent Industrial Applications
M KANO, K FUJIWARA
Journal of Chemical Engineering of Japan 46 (1), 1-17, 2013
2132013
Evolution of multivariate statistical process control: application of independent component analysis and external analysis
M Kano, S Hasebe, I Hashimoto, H Ohno
Computers & chemical engineering 28 (6-7), 1157-1166, 2004
2022004
Epileptic seizure prediction based on multivariate statistical process control of heart rate variability features
K Fujiwara, M Miyajima, T Yamakawa, E Abe, Y Suzuki, Y Sawada, ...
IEEE Transactions on Biomedical Engineering 63 (6), 1321-1332, 2015
2002015
Statistical process monitoring based on dissimilarity of process data
M Kano, S Hasebe, I Hashimoto, H Ohno
AIChE Journal 48 (6), 1231-1240, 2002
1892002
Estimation of active pharmaceutical ingredients content using locally weighted partial least squares and statistical wavelength selection
S Kim, M Kano, H Nakagawa, S Hasebe
International journal of pharmaceutics 421 (2), 269-274, 2011
1652011
Comparison of statistical process monitoring methods: application to the Eastman challenge problem
M Kano, K Nagao, S Hasebe, I Hashimoto, H Ohno, R Strauss, B Bakshi
Computers & Chemical Engineering 24 (2-7), 175-181, 2000
1152000
Development of soft-sensor using locally weighted PLS with adaptive similarity measure
S Kim, R Okajima, M Kano, S Hasebe
Chemometrics and Intelligent Laboratory Systems 124, 43-49, 2013
1112013
Long-Term Industrial Applications of Inferential Control Based on Just-In-Time Soft-sensors: Economical Impact and Challenges
S Kim, M Kano, S Hasebe, A Takinami, T Seki
Industrial & Engineering Chemistry Research 124, 43-49, 2013
1032013
Adaptive virtual metrology design for semiconductor dry etching process through locally weighted partial least squares
T Hirai, M Kano
IEEE Transactions on Semiconductor Manufacturing 28 (2), 137-144, 2015
982015
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