| Comparison of a 65 nm CMOS Ring-and LC-Oscillator Based PLL in Terms of TID and SEU Sensitivity J Prinzie, J Christiansen, P Moreira, M Steyaert, P Leroux IEEE Transactions on Nuclear Science 64 (1), 245-252, 2016 | 66 | 2016 |
| Low-power electronic technologies for harsh radiation environments J Prinzie, FM Simanjuntak, P Leroux, T Prodromakis Nature Electronics 4 (4), 243-253, 2021 | 53 | 2021 |
| A 2.56-GHz SEU Radiation Hard -Tank VCO for High-Speed Communication Links in 65-nm CMOS Technology J Prinzie, J Christiansen, P Moreira, M Steyaert, P Leroux IEEE Transactions on Nuclear Science 65 (1), 407-412, 2017 | 46 | 2017 |
| A review of semiconductor based ionising radiation sensors used in Harsh radiation environments and their applications A Karmakar, J Wang, J Prinzie, V De Smedt, P Leroux Radiation 1 (3), 194-217, 2021 | 36 | 2021 |
| A single-event upset robust, 2.2 GHz to 3.2 GHz, 345 fs jitter PLL with triple-modular redundant phase detector in 65 nm CMOS J Prinzie, M Steyaert, P Leroux, J Christiansen, P Moreira 2016 IEEE Asian Solid-State Circuits Conference (A-SSCC), 285-288, 2016 | 26 | 2016 |
| Study of SEU sensitivity of SRAM-based radiation monitors in 65-nm CMOS J Wang, J Prinzie, A Coronetti, S Thys, RG Alia, P Leroux IEEE Transactions on Nuclear Science 68 (5), 913-920, 2021 | 22 | 2021 |
| SISSA: The lpGBT PLL and CDR Architecture, Performance and SEE Robustness S Biereigel, P Moreira, S Kulis, R Francisco, PV Leitao, P Leroux, ... PoS, 034, 2020 | 20 | 2020 |
| A low noise fault tolerant radiation hardened 2.56 Gbps clock-data recovery circuit with high speed feed forward correction in 65 nm CMOS S Biereigel, S Kulis, P Leitao, R Francisco, P Moreira, P Leroux, J Prinzie IEEE Transactions on Circuits and Systems I: Regular Papers 67 (5), 1438-1446, 2019 | 19 | 2019 |
| An SRAM-Based Radiation Monitor With Dynamic Voltage Control in 0.18- m CMOS Technology J Prinzie, S Thys, B Van Bockel, J Wang, V De Smedt, P Leroux IEEE Transactions on Nuclear Science 66 (1), 282-289, 2018 | 16 | 2018 |
| Radiation-tolerant digitally controlled ring oscillator in 65-nm CMOS S Biereigel, S Kulis, P Leroux, P Moreira, J Prinzie IEEE Transactions on Nuclear Science 69 (1), 17-25, 2021 | 15 | 2021 |
| Single-event effect responses of integrated planar inductors in 65-nm CMOS S Biereigel, S Kulis, P Leroux, P Moreira, A Kölpin, J Prinzie IEEE transactions on nuclear science 68 (11), 2587-2597, 2021 | 14 | 2021 |
| A self-calibrated bang–bang phase detector for low-offset time signal processing J Prinzie, M Steyaert, P Leroux IEEE Transactions on Circuits and Systems II: Express Briefs 63 (5), 453-457, 2015 | 14 | 2015 |
| lpGBT documentation: release P Moreira, S Baron, S Biereigel, J Carvalho, B Faes, M Firlej, T Fiutowski, ... CERN, Switzerland, 2022 | 12 | 2022 |
| Radiation-tolerant all-digital PLL/CDR with varactorless LC DCO in 65 nm CMOS S Biereigel, S Kulis, P Moreira, A Kölpin, P Leroux, J Prinzie Electronics 10 (22), 2741, 2021 | 12 | 2021 |
| Radiation assessment of a 15.6 ps single-shot time-to-digital converter in terms of TID B Van Bockel, J Prinzie, P Leroux Electronics 8 (5), 558, 2019 | 12 | 2019 |
| Optimal physical implementation of radiation tolerant high-speed digital integrated circuits in deep-submicron technologies J Prinzie, K Appels, S Kulis Electronics 8 (4), 432, 2019 | 12 | 2019 |
| Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing J rey Prinzie, M Steyaert, P Leroux Springer, 2018 | 12 | 2018 |
| Radiation effects in CMOS technology J Prinzie, M Steyaert, P Leroux, J Prinzie, M Steyaert, P Leroux Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing …, 2018 | 10 | 2018 |
| A single shot TDC with 4.8 ps resolution in 40 nm CMOS for high energy physics applications J Prinzie, M Steyaert, P Leroux Journal of Instrumentation 10 (01), C01031, 2015 | 10 | 2015 |
| Characterization of a gigabit transceiver for the ATLAS inner tracker pixel detector readout upgrade C Chen, D Gong, D Guo, G Huang, X Huang, S Kulis, P Leroux, C Liu, ... Journal of Instrumentation 15 (03), T03005, 2020 | 9 | 2020 |
