Electrical characterisation of SiON/n-Si structures for MOS VLSI electronics N Konofaos Microelectronics journal 35 (5), 421-425, 2004 | 87 | 2004 |
Reduced molybdenum oxide as an efficient electron injection layer in polymer light-emitting diodes M Vasilopoulou, LC Palilis, DG Georgiadou, P Argitis, S Kennou, ... Applied Physics Letters 98 (12), 2011 | 64 | 2011 |
Electrical properties of thin films on Si deposited by magnetron sputtering at low temperature Z Wang, V Kugler, U Helmersson, N Konofaos, EK Evangelou, S Nakao, ... Applied Physics Letters 79 (10), 1513-1515, 2001 | 60 | 2001 |
Dielectric properties and electronic transitions of porous and nanostructured cerium oxide films S Logothetidis, P Patsalas, EK Evangelou, N Konofaos, I Tsiaoussis, ... Materials Science and Engineering: B 109 (1-3), 69-73, 2004 | 56 | 2004 |
Characterisation of the Interface States between Amorphous Diamond‐Like Carbon Films and (100) Silicon N Konofaos, IP McClean, CB Thomas physica status solidi (a) 161 (1), 111-123, 1997 | 56 | 1997 |
Electrical characterization of the SiON/Si interface for applications on optical and MOS devices N Konofaos, EK Evangelou Semiconductor science and technology 18 (1), 56, 2002 | 53 | 2002 |
Characterization of heterojunction devices constructed by amorphous diamondlike films on silicon N Konofaos, CB Thomas Journal of applied physics 81 (9), 6238-6245, 1997 | 50 | 1997 |
Tungsten oxides as interfacial layers for improved performance in hybrid optoelectronic devices M Vasilopoulou, LC Palilis, DG Georgiadou, P Argitis, S Kennou, I Kostis, ... Thin Solid Films 519 (17), 5748-5753, 2011 | 45 | 2011 |
Design of Low-Power High-Performance 2–4 and 4–16 Mixed-Logic Line Decoders D Balobas, N Konofaos IEEE Transactions on Circuits and Systems II: Express Briefs 64 (2), 176 - 180, 2017 | 44 | 2017 |
Target localization utilizing the success rate in infrared pattern recognition N Petrellis, N Konofaos, GP Alexiou IEEE Sensors Journal 6 (5), 1355-1364, 2006 | 44 | 2006 |
Dielectric properties of CVD grown SiON thin films on Si for MOS microelectronic devices N Konofaos, EK Evangelou, X Aslanoglou, M Kokkoris, R Vlastou Semiconductor science and technology 19 (1), 50, 2003 | 36 | 2003 |
Properties of barium titanate (BaTiO3) thin films grown on silicon by rf magnetron sputtering EK Evangelou, N Konofaos, CB Thomas Philosophical Magazine B 80 (3), 395-407, 2000 | 34 | 2000 |
Characterisation of the BaTiO3/p-Si interface and applications EK Evangelou, N Konofaos, MR Craven, WM Cranton, CB Thomas Applied surface science 166 (1-4), 504-507, 2000 | 32 | 2000 |
Rare earth oxides as high-k dielectrics for Ge based MOS devices: An electrical study of Pt/Gd2O3/Ge capacitors EK Evangelou, G Mavrou, A Dimoulas, N Konofaos Solid-state electronics 51 (1), 164-169, 2007 | 31 | 2007 |
Electrical characterisation of SrTiO3/Si interfaces N Konofaos, EK Evangelou, Z Wang, V Kugler, U Helmersson Journal of non-crystalline solids 303 (1), 185-189, 2002 | 28 | 2002 |
Amorphous diamondlike carbon‐silicon heterojunction devices formed by ion implantation N Konofaos, CB Thomas Applied physics letters 61 (23), 2805-2807, 1992 | 28 | 1992 |
Gate stack dielectric degradation of rare-earth oxides grown on high mobility Ge substrates S Rahman, EK Evangelou, N Konofaos, A Dimoulas Journal of Applied Physics 112 (9), 2012 | 27 | 2012 |
Properties and density of states of the interface between silicon and carbon films rich in bonds S Logothetidis, E Evangelou, N Konofaos Journal of applied physics 82 (10), 5017-5020, 1997 | 27 | 1997 |
Α quantum pattern recognition method for improving pairwise sequence alignment K Prousalis, N Konofaos Scientific reports 9 (1), 7226, 2019 | 26 | 2019 |
Design and simulation of 6T SRAM cell architectures in 32nm technology G Apostolidis, D Balobas, N Konofaos Journal of Engineering Science and Technology Review 9 (5), 145-149, 2016 | 25 | 2016 |