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Terrance O'Regan
Terrance O'Regan
Electrical Engineer, DEVCOM Army Research Laboratory
在 mail.mil 的电子邮件经过验证
标题
引用次数
引用次数
年份
Electrical performance of monolayer MoS2 field-effect transistors prepared by chemical vapor deposition
M Amani, ML Chin, AG Birdwell, TP O’Regan, S Najmaei, Z Liu, ...
Applied Physics Letters 102 (19), 2013
2742013
Temperature-dependent phonon shifts in monolayer MoS2
NA Lanzillo, A Glen Birdwell, M Amani, FJ Crowne, PB Shah, S Najmaei, ...
Applied Physics Letters 103 (9), 2013
2732013
Vertical 2D/3D semiconductor heterostructures based on epitaxial molybdenum disulfide and gallium nitride
D Ruzmetov, K Zhang, G Stan, B Kalanyan, GR Bhimanapati, SM Eichfeld, ...
Acs Nano 10 (3), 3580-3588, 2016
2552016
Electrical transport properties of polycrystalline monolayer molybdenum disulfide
S Najmaei, M Amani, ML Chin, Z Liu, AG Birdwell, TP O’Regan, ...
ACS nano 8 (8), 7930-7937, 2014
1502014
Theoretical study of some physical aspects of electronic transport in nMOSFETs at the 10-nm gate-length
MV Fischetti, TP O'Regan, S Narayanan, C Sachs, S Jin, J Kim, Y Zhang
IEEE Transactions on Electron Devices 54 (9), 2116-2136, 2007
1432007
Theoretical study on strain-induced variations in electronic properties of monolayer MoS2
L Dong, RR Namburu, TP O’Regan, M Dubey, AM Dongare
Journal of Materials Science 49, 6762-6771, 2014
802014
Blueshift of the -exciton peak in folded monolayer -MoS
FJ Crowne, M Amani, AG Birdwell, ML Chin, TP O’Regan, S Najmaei, ...
Physical Review B—Condensed Matter and Materials Physics 88 (23), 235302, 2013
492013
Theoretical study on strain induced variations in electronic properties of 2H-MoS2 bilayer sheets
L Dong, AM Dongare, RR Namburu, TP O'Regan, M Dubey
Applied Physics Letters 104 (5), 2014
462014
Analysis of temperature dependent hysteresis in MoS2 field effect transistors for high frequency applications
PB Shah, M Amani, ML Chin, TP O’regan, FJ Crowne, M Dubey
Solid-state electronics 91, 87-90, 2014
442014
Planar metal–insulator–metal diodes based on the Nb/Nb2O5/X material system
ML Chin, P Periasamy, TP O'Regan, M Amani, C Tan, RP O'Hayre, ...
Journal of Vacuum Science & Technology B 31 (5), 2013
432013
Calculation of the electron mobility in III-V inversion layers with high-κ dielectrics
TP O’Regan, MV Fischetti, B Sorée, S Jin, W Magnus, M Meuris
Journal of Applied Physics 108 (10), 2010
402010
Structural and electrical analysis of epitaxial 2D/3D vertical heterojunctions of monolayer MoS2 on GaN
TP O'Regan, D Ruzmetov, MR Neupane, RA Burke, AA Herzing, K Zhang, ...
Applied Physics Letters 111 (5), 2017
392017
Modeling the capacitance-voltage response of In 0.53 Ga 0.47 As metal-oxide-semiconductor structures: Charge quantization and nonparabolic corrections
TP O’Regan, PK Hurley, B Sorée, MV Fischetti
Applied Physics Letters 96 (21), 2010
352010
Diffusion of In0. 53Ga0. 47As elements through hafnium oxide during post deposition annealing
W Cabrera, B Brennan, H Dong, TP O'Regan, IM Povey, S Monaghan, ...
Applied Physics Letters 104 (1), 2014
322014
Electrically active interface defects in the In0. 53Ga0. 47As MOS system
V Djara, TP O’Regan, K Cherkaoui, M Schmidt, S Monaghan, É O’Connor, ...
Microelectronic engineering 109, 182-188, 2013
292013
Edge effects on band gap energy in bilayer 2H-MoS2 under uniaxial strain
L Dong, J Wang, R Namburu, TP O'Regan, M Dubey, AM Dongare
Journal of Applied Physics 117 (24), 2015
252015
Theory of hole mobility in strained Ge and III-V p-channel inversion layers with high-κ insulators
Y Zhang, MV Fischetti, B Sorée, T O’Regan
Journal of Applied Physics 108 (12), 2010
222010
Van der Waals interfaces in epitaxial vertical metal/2D/3D semiconductor heterojunctions of monolayer MoS2 and GaN
D Ruzmetov, MR Neupane, A Herzing, TP O’Regan, A Mazzoni, ML Chin, ...
2D Materials 5 (4), 045016, 2018
212018
Calculation of the capacitance-voltage characteristic of GaAs, In0. 53Ga0. 47As, and InAs metal-oxide-semiconductor structures
TP O’Regan, PK Hurley
Applied Physics Letters 99 (16), 2011
212011
Band structure modulation in MoS2 multilayers and heterostructures through electric field and strain
NA Lanzillo, TP O’Regan, SK Nayak
Computational Materials Science 112, 377-382, 2016
172016
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