| Flexibility of a combined heat and power system with thermal energy storage for district heating T Nuytten, B Claessens, K Paredis, J Van Bael, D Six Applied energy 104, 583-591, 2013 | 477 | 2013 |
| Evolution of the Structure and Chemical State of Pd Nanoparticles during the in Situ Catalytic Reduction of NO with H2 K Paredis, LK Ono, F Behafarid, Z Zhang, JC Yang, AI Frenkel, ... Journal of the american chemical society 133 (34), 13455-13464, 2011 | 122 | 2011 |
| Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformity D Chiappe, J Ludwig, A Leonhardt, S El Kazzi, AN Mehta, T Nuytten, ... Nanotechnology 29 (42), 425602, 2018 | 65 | 2018 |
| Thermodynamic properties of Pt nanoparticles: Size, shape, support, and adsorbate effects B Roldan Cuenya, M Alcántara Ortigoza, LK Ono, F Behafarid, S Mostafa, ... Physical Review B—Condensed Matter and Materials Physics 84 (24), 245438, 2011 | 65 | 2011 |
| Structure, chemical composition, and reactivity correlations during the in situ oxidation of 2-Propanol K Paredis, LK Ono, S Mostafa, L Li, Z Zhang, JC Yang, L Barrio, AI Frenkel, ... Journal of the American Chemical Society 133 (17), 6728-6735, 2011 | 54 | 2011 |
| H2S exposure of a (100) Ge surface: Evidences for a (2× 1) electrically passivated surface M Houssa, D Nelis, D Hellin, G Pourtois, T Conard, K Paredis, ... Applied physics letters 90 (22), 2007 | 53 | 2007 |
| Dopant, composition and carrier profiling for 3D structures W Vandervorst, C Fleischmann, J Bogdanowicz, A Franquet, U Celano, ... Materials Science in Semiconductor Processing 62, 31-48, 2017 | 52 | 2017 |
| The influence of interface roughness on the magnetic properties of exchange biased CoO/Fe thin films C Fleischmann, F Almeida, J Demeter, K Paredis, A Teichert, R Steitz, ... Journal of Applied Physics 107 (11), 2010 | 38 | 2010 |
| Mesoscopic physical removal of material using sliding nano-diamond contacts U Celano, FC Hsia, D Vanhaeren, K Paredis, TEM Nordling, JG Buijnsters, ... Scientific reports 8 (1), 2994, 2018 | 37 | 2018 |
| Size-dependent evolution of the atomic vibrational density of states and thermodynamic properties of isolated Fe nanoparticles B Roldan Cuenya, LK Ono, JR Croy, K Paredis, A Kara, H Heinrich, ... Physical Review B—Condensed Matter and Materials Physics 86 (16), 165406, 2012 | 34 | 2012 |
| Electrical properties of extended defects in strain relaxed GeSn S Gupta, E Simoen, R Loo, Y Shimura, C Porret, F Gencarelli, K Paredis, ... Applied Physics Letters 113 (2), 2018 | 26 | 2018 |
| Diamond scanning probes with sub-nanometer resolution for advanced nanoelectronics device characterization T Hantschel, M Tsigkourakos, L Zha, T Nuytten, K Paredis, B Majeed, ... Microelectronic Engineering 159, 46-50, 2016 | 25 | 2016 |
| Experimental and theoretical study of Ge surface passivation M Houssa, G Pourtois, B Kaczer, B De Jaeger, FE Leys, D Nelis, ... Microelectronic engineering 84 (9-10), 2267-2273, 2007 | 25 | 2007 |
| Effects of buried grain boundaries in multilayer MoS2 J Ludwig, AN Mehta, M Mascaro, U Celano, D Chiappe, H Bender, ... Nanotechnology 30 (28), 285705, 2019 | 22 | 2019 |
| Fabrication of magnetic tunnel junctions connected through a continuous free layer to enable spin logic devices D Wan, M Manfrini, A Vaysset, L Souriau, L Wouters, A Thiam, ... Japanese Journal of Applied Physics 57 (4S), 04FN01, 2018 | 21 | 2018 |
| Ferroelectricity in Si-doped hafnia: probing challenges in absence of screening charges U Celano, A Gomez, P Piedimonte, S Neumayer, L Collins, M Popovici, ... Nanomaterials 10 (8), 1576, 2020 | 19 | 2020 |
| Revealing the 3-dimensional shape of atom probe tips by atomic force microscopy C Fleischmann, K Paredis, D Melkonyan, W Vandervorst Ultramicroscopy 194, 221-226, 2018 | 18 | 2018 |
| The impact of focused ion beam induced damage on scanning spreading resistance microscopy measurements K Pandey, K Paredis, T Hantschel, C Drijbooms, W Vandervorst Scientific Reports 10 (1), 14893, 2020 | 16 | 2020 |
| The influence of a Cu buffer layer on the self-assembly of iron silicide nanostructures on Si (111) K Paredis, K Vanormelingen, A Vantomme Applied Physics Letters 92 (4), 2008 | 11 | 2008 |
| Individual device analysis using hybrid TEM-scalpel SSRM metrology U Celano, P Favia, C Drijbooms, O Dixon-Luinenburg, O Richard, ... Frontiers of Characterization and Metrology for Nanoelectronics, 2017 | 8 | 2017 |
