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Volodymyr Ilchenko
Volodymyr Ilchenko
其他姓名Володимир Ільченко, V.V.Ilchenko, Ilchenko V.V.
Професор фізики, Київський національний університет імені Тараса Шевченка
在 knu.ua 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
Deep level transient spectroscopy characterization of InAs self-assembled quantum dots
VV Ilchenko, SD Lin, CP Lee, OV Tretyak
Journal of Applied Physics 89 (2), 1172-1174, 2001
472001
Frequency dependence of negative differential capacitance in Schottky diodes with InAs quantum dots
SD Lin, VV Ilchenko, VV Marin, KY Panarin, AA Buyanin, OV Tretyak
Applied Physics Letters 93 (10), 2008
222008
Room temperature negative differential capacitance in self-assembled quantum dots
VV Ilchenko, VV Marin, SD Lin, KY Panarin, AA Buyanin, OV Tretyak
Journal of Physics D: Applied Physics 41 (23), 235107, 2008
172008
Observation of the negative differential capacitance in Schottky diodes with InAs quantum dots near room temperature
SD Lin, VV Ilchenko, VV Marin, NV Shkil, AA Buyanin, KY Panarin, ...
Applied physics letters 90 (26), 2007
142007
Университет исследовательского и предпринимательского типа: европейский опыт для Молдовы, России и Украины
Г Андрощук, Т Бодюл, А Бутник-Сиверский, Л Виеру, П Гаугаш, ...
Общество с ограниченой ответственностью «ТАТ ГРУП», 2011
92011
Electrical properties of MIS structures with silicon nanoclusters
SV Bunak, VV Ilchenko, VP Melnik, IM Hatsevych, BN Romanyuk, ...
Semiconductor Physics Quantum Electronics & Optoelectronics, 2011
62011
Electrical properties of semiconductor structures with Si nanoclusters in SiO₂ grown by high temperature annealing technology of SiOx layer, X< 2
SV Bunak, AA Buyanin, VV Ilchenko, VV Marin, VP Melnik, IM Khacevich, ...
Semiconductor Physics Quantum Electronics & Optoelectronics, 2010
62010
Admittance spectroscopy using for the determination of parameters of Si nanoclusters embedded in SiO2
VV Ilchenko, VV Marin, IS Vasyliev, OV Tretyak, OL Bratus, AA Evtukh
2014 IEEE 34th International Scientific Conference on Electronics and …, 2014
52014
Determination of Vibration Object'Coordinate on Surface of Earth
VA Zelinsky, SV Lysochenko, VV Ilchenko, MM Nikiforov, OL Kulsky, ...
Control systems & computers, 43-55, 2022
22022
Peculiarities of electron transport in SiOx films obtained by ion-plasma sputtering
OL Bratus, AA Evtukh, VV Ilchenko
Applied Nanoscience 10, 2723-2729, 2020
22020
Capacitive and Inductive Properties of Composite Films with Silicon and Metal Nanocrystals
V Ievtukh, A Kizjak, A Evtukh, V Ilchenko, V Marin
2019 IEEE 39th International Conference on Electronics and Nanotechnology …, 2019
22019
Capacitive Properties of MIS Structures with SiOx and SixOyNz Films Containing Si Nanoclusters
A Evtukh, V Ilchenko, V Marin, I Vasyliev
Journal of Nano Research 39, 162-168, 2016
22016
Formation of shallow np junctions in Cz-Si by low-energy implantation of carbon ions
B Romanyuk, V Melnik, V Popov, V Litovchenko, V Babich, V Ilchenko, ...
ECS Transactions 64 (11), 187, 2014
22014
Modelling of the frequency dependence of capacitance-voltage characteristics of metal semiconductor contact with quantum dot layer
VV Ilchenko, KY Panarin, AA Buyanin, VV Marin, NV Shkil, OV Tretyak
Journal of Physical Studies 12 (1), 18011-18017, 2008
12008
THE EFFECT OF IMAGE FORCES ON THE VOLTAGE-CURRENT CHARACTERISTICS OF CONTACTS METAL-ALPHA-SI
VV ILCHENKO, VI Strikha
IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA 28 (2), 88-92, 1985
11985
Algorithms for Separating the Sum of Vibrations and Identifying their Sources
VA Zelinsky, SV Lуsochenko, VV Ilchenko, YL Sheredeko
Control systems & computers, 3-12, 2022
2022
Admittance spectroscopy of charge traps of FET based on nanotubes
V Ilchenko, I Vasyliev, V Derenskyi, M Gerasymenko, MA Loi
2017 IEEE 37th International Conference on Electronics and Nanotechnology …, 2017
2017
Modelling of the Frequency Dependence of-Characteristics of-Contact with Quantum Dot Layer
VV Ilchenko, KY Panarin, AA Buyanin, VV Marin, NV Shkil, OV Tretyak
Journal of Physical Studies 12 (1), 1801, 2008
2008
Coherent tunneling in a semiconductor system: Double barrier resonant-tunneling structure built in the Schottky barrier
SD Lin, CP Lee, VV Ilchenko, DI Sheka, OV Tretyak, AM Korol, ...
Journal of Physical Studies 11 (3), 294-297, 2007
2007
INVESTIGATION OF NEGATIVE DIFFERENTIAL CAPACITANCE-VOLTAGE DEPENDENCES OF SHOTTKY DIODE STRUCTURES WITH GAAS/INAS QDS
SD Lin, CP Lee, VV Ilchenko, VV Marin, MV Shkil, AA Buyanin, ...
Сенсорна електроніка і мікросистемні технології 3 (2), 3-9, 2006
2006
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