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barbara de salvo
barbara de salvo
CEA LETI
在 cea.fr 的电子邮件经过验证
标题
引用次数
引用次数
年份
Phase change memory as synapse for ultra-dense neuromorphic systems: Application to complex visual pattern extraction
M Suri, O Bichler, D Querlioz, O Cueto, L Perniola, V Sousa, D Vuillaume, ...
2011 International Electron Devices Meeting, 4.4. 1-4.4. 4, 2011
3492011
A stacked SONOS technology, up to 4 levels and 6nm crystalline nanowires, with gate-all-around or independent gates (Φ-Flash), suitable for full 3D integration
A Hubert, E Nowak, K Tachi, V Maffini-Alvaro, C Vizioz, C Arvet, ...
2009 IEEE International Electron Devices Meeting (IEDM), 1-4, 2009
3242009
Bio-inspired stochastic computing using binary CBRAM synapses
M Suri, D Querlioz, O Bichler, G Palma, E Vianello, D Vuillaume, ...
IEEE Transactions on Electron Devices 60 (7), 2402-2409, 2013
2682013
HfO2-Based OxRAM Devices as Synapses for Convolutional Neural Networks
D Garbin, E Vianello, O Bichler, Q Rafhay, C Gamrat, G Ghibaudo, ...
IEEE Transactions on Electron Devices 62 (8), 2494-2501, 2015
2242015
Visual pattern extraction using energy-efficient “2-PCM synapse” neuromorphic architecture
O Bichler, M Suri, D Querlioz, D Vuillaume, B DeSalvo, C Gamrat
IEEE Transactions on Electron Devices 59 (8), 2206-2214, 2012
2142012
Experimental and theoretical investigation of nano-crystal and nitride-trap memory devices
B De Salvo, G Ghibaudo, G Pananakakis, P Masson, T Baron, N Buffet, ...
IEEE Transactions on Electron Devices 48 (8), 1789-1799, 2001
1772001
CBRAM devices as binary synapses for low-power stochastic neuromorphic systems: auditory (cochlea) and visual (retina) cognitive processing applications
M Suri, O Bichler, D Querlioz, G Palma, E Vianello, D Vuillaume, ...
2012 International Electron Devices Meeting, 10.3. 1-10.3. 4, 2012
1732012
Physical aspects of low power synapses based on phase change memory devices
M Suri, O Bichler, D Querlioz, B Traoré, O Cueto, L Perniola, V Sousa, ...
Journal of Applied Physics 112 (5), 2012
1622012
Electrical behavior of phase-change memory cells based on GeTe
L Perniola, V Sousa, A Fantini, E Arbaoui, A Bastard, M Armand, ...
IEEE Electron Device Letters 31 (5), 488-490, 2010
1592010
Understanding RRAM endurance, retention and window margin trade-off using experimental results and simulations
C Nail, G Molas, P Blaise, G Piccolboni, B Sklenard, C Cagli, M Bernard, ...
2016 IEEE International Electron Devices Meeting (IEDM), 4.5. 1-4.5. 4, 2016
1252016
How far will silicon nanocrystals push the scaling limits of NVMs technologies?
B De Salvo, C Gerardi, S Lombardo, T Baron, L Perniola, D Mariolle, ...
IEEE International Electron Devices Meeting 2003, 26.1. 1-26.1. 4, 2003
1142003
Silicon nanocrystal memories
S Lombardo, B De Salvo, C Gerardi, T Baron
Microelectronic Engineering 72 (1-4), 388-394, 2004
1112004
Experimental and theoretical study of electrode effects in HfO2 based RRAM
C Cagli, J Buckley, V Jousseaume, T Cabout, A Salaun, H Grampeix, ...
2011 International Electron Devices Meeting, 28.7. 1-28.7. 4, 2011
1062011
Performance and reliability features of advanced nonvolatile memories based on discrete traps (silicon nanocrystals, SONOS)
B De Salvo, C Gerardi, R van Schaijk, SA Lombardo, D Corso, ...
IEEE Transactions on Device and Materials reliability 4 (3), 377-389, 2004
1042004
HfO2-Based RRAM: Electrode Effects, Ti/HfO2 Interface, Charge Injection, and Oxygen (O) Defects Diffusion Through Experiment and Ab Initio Calculations
B Traoré, P Blaise, E Vianello, L Perniola, B De Salvo, Y Nishi
IEEE Transactions on Electron Devices 63 (1), 360-368, 2015
982015
Carbon-doped GeTe: a promising material for phase-change memories
GB Beneventi, L Perniola, V Sousa, E Gourvest, S Maitrejean, JC Bastien, ...
Solid-State Electronics 65, 197-204, 2011
982011
Variability-tolerant convolutional neural network for pattern recognition applications based on OxRAM synapses
D Garbin, O Bichler, E Vianello, Q Rafhay, C Gamrat, L Perniola, ...
2014 IEEE international electron devices meeting, 28.4. 1-28.4. 4, 2014
882014
Experimental and theoretical investigation of nonvolatile memory data-retention
B De Salvo, G Ghibaudo, G Pananakakis, G Reimbold, F Mondond, ...
IEEE Transactions on Electron Devices 46 (7), 1518-1524, 1999
881999
On the Origin of Low-Resistance State Retention Failure in HfO2-Based RRAM and Impact of Doping/Alloying
B Traoré, P Blaise, E Vianello, H Grampeix, S Jeannot, L Perniola, ...
IEEE Transactions on Electron Devices 62 (12), 4029-4036, 2015
852015
Novel Si-based nanowire devices: Will they serve ultimate MOSFETs scaling or ultimate hybrid integration?
T Ernst, L Duraffourg, C Dupre, E Bernard, P Andreucci, S Bécu, E Ollier, ...
2008 IEEE International Electron Devices Meeting, 1-4, 2008
842008
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