| A comparative study of automatic program repair techniques for security vulnerabilities E Pinconschi, R Abreu, P Adão 2021 IEEE 32nd international symposium on software reliability engineering …, 2021 | 17 | 2021 |
| A transformer-based IDE plugin for vulnerability detection C Mamede, E Pinconschi, R Abreu Proceedings of the 37th IEEE/ACM International Conference on Automated …, 2022 | 10 | 2022 |
| Exploring transformers for multi-label classification of java vulnerabilities C Mamede, E Pinconschi, R Abreu, J Campos 2022 IEEE 22nd International Conference on Software Quality, Reliability and …, 2022 | 9 | 2022 |
| Maestro: A platform for benchmarking automatic program repair tools on software vulnerabilities E Pinconschi, QC Bui, R Abreu, P Adão, R Scandariato Proceedings of the 31st ACM SIGSOFT international symposium on software …, 2022 | 6 | 2022 |
| Evaluating Deep Neural Networks in Deployment (A Comparative and Replicability Study) E Pinconschi, D Gopinath, R Abreu, CS Pasareanu arXiv preprint arXiv:2407.08730, 2024 | 1 | 2024 |
| Evaluating Deep Neural Networks in Deployment: A Comparative Study (Replicability Study) E Pinconschi, D Gopinath, R Abreu, CS Păsăreanu Proceedings of the 33rd ACM SIGSOFT International Symposium on Software …, 2024 | | 2024 |
| A Study of Fine-Tuned Language Models in Vulnerability Classification O Ezenwoye, E Pinconschi 2024 12th International Symposium on Digital Forensics and Security (ISDFS), 1-6, 2024 | | 2024 |
| Tenet: A Flexible Framework for Machine-Learning-based Vulnerability Detection E Pinconschi, S Reis, C Zhang, R Abreu, H Erdogmus, CS Păsăreanu, ... 2023 IEEE/ACM 2nd International Conference on AI Engineering–Software …, 2023 | | 2023 |
| A Comparative Study of Automatic Software Repair Techniques for Security Faults EC Pinconschi | | 2021 |
| Labeling Software Security Vulnerabilities N Irena Bojanova, J Guerrerio, E Pinconschi | | |
| 2023 IEEE/ACM 2nd International Conference on AI Engineering–Software Engineering for AI (CAIN)| 979-8-3503-0113-7/23/$31.00© 2023 IEEE| DOI: 10.1109/CAIN58948. 2023.00037 R Abreu, C Akiki, H Aldebes, A Badii, J Bogner, M Borg, L Boué, B Brown, ... | | |
