| A device-to-system perspective regarding self-heating enhanced hot carrier degradation in modern field-effect transistors: A topical review MA Alam, BK Mahajan, YP Chen, W Ahn, H Jiang, SH Shin IEEE Transactions on Electron Devices 66 (11), 4556-4565, 2019 | 45 | 2019 |
| Electrothermal performance limit of β-Ga2O3 field-effect transistors BK Mahajan, YP Chen, J Noh, PD Ye, MA Alam Applied Physics Letters 115 (17), 2019 | 34 | 2019 |
| Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In2O3 Thin-Film Transistors YP Chen, M Si, BK Mahajan, Z Lin, DY Peide, MA Alam IEEE Electron Device Letters 43 (2), 232-235, 2021 | 18 | 2021 |
| A novel ‘IV spectroscopy’technique to deconvolve threshold voltage and mobility degradation in LDMOS transistors YP Chen, BK Mahajan, D Varghese, S Krishnan, V Reddy, MA Alam 2020 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2020 | 10 | 2020 |
| Self-heating and reliability-aware “intrinsic” safe operating Area of wide bandgap semiconductors—an analytical approach BK Mahajan, YP Chen, N Zagni, MA Alam IEEE Transactions on Device and Materials Reliability 21 (4), 518-527, 2021 | 8 | 2021 |
| Super single pulse charge pumping technique for profiling interfacial defects YP Chen, BK Mahajan, D Varghese, S Krishnan, V Reddy, MA Alam IEEE Transactions on Electron Devices 68 (2), 726-732, 2021 | 7 | 2021 |
| Design and Optimization of -Ga2O3 on (h-BN layered) Sapphire for High Efficiency Power Transistors: A Device-Circuit-Package Perspective BK Mahajan, YP Chen, W Ahn, N Zagni, MA Alam 2018 IEEE International Electron Devices Meeting (IEDM), 24.6. 1-24.6. 4, 2018 | 7 | 2018 |
| A junctionless silicon carbide transistor for harsh environment applications RK Baruah, BK Mahajan, YP Chen, RP Paily Journal of Electronic Materials 50 (10), 5682-5690, 2021 | 6 | 2021 |
| An analytical model of hot carrier degradation in LDMOS transistors: Rediscovery of universal scaling BK Mahajan, YP Chen, MA Alam IEEE Transactions on Electron Devices 68 (8), 3923-3929, 2021 | 6 | 2021 |
| Quantifying region-specific hot carrier degradation in LDMOS transistors using a novel charge pumping technique BK Mahajan, YP Chen, D Varghese, V Reddy, S Krishnan, MA Alam 2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021 | 6 | 2021 |
| High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics SH Shin, YP Chen, W Ahn, H Guo, B Williams, J West, T Bonifield, ... 2018 IEEE International Reliability Physics Symposium (IRPS), P-GD. 9-1-P-GD …, 2018 | 4 | 2018 |
| Three-point I–V spectroscopy deconvolves region-specific degradations in LDMOS transistors YP Chen, BK Mahajan, D Varghese, S Krishnan, V Reddy, MA Alam Applied Physics Letters 119 (12), 2021 | 3 | 2021 |
| An analytical transient Joule heating model for an interconnect in a modern IC: Material selection (Cu, Co, Ru) and cooling strategies W Ahn, YP Chen, MA Alam 2019 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2019 | 2 | 2019 |
| Reduced QCSE in InGaN-based LEDs by patterned sapphire substrates with enlarging the diameter of hexagonal hole YP Chen, V Su, ML Lee, YH You, PH Chen, RM Lin, CH Kuan Nanotechnology VII 9519, 92-98, 2015 | 1 | 2015 |
| Short circuit current improvement of Si HIT solar cell by optimal and “chess board” like 1-D light trapping periodical grating structure ML Lee, C Nien, HC Lin, YH You, VC Su, PH Chen, HB Yang, YP Chen, ... CLEO: Applications and Technology, JTh2A. 1, 2014 | 1 | 2014 |
| Utilizing two-dimensional photonic crystals to investigate the correlation between the air duty cycle and the light extraction efficiency of InGaN-based light-emitting diodes ML Lee, YH You, CJ Hsieh, VC Su, C Nien, PH Chen, HC Lin, HB Yang, ... CLEO: Science and Innovations, SM1J. 6, 2014 | | 2014 |
Muhammad Ashraful AlamJai N. Gupta Professor of Electrical Engineering, Purdue University在 purdue.edu 的电子邮件经过验证
Muhammad Ashraful AlamJai N. Gupta Professor of Electrical Engineering, Purdue University在 purdue.edu 的电子邮件经过验证
Woojin AhnIntel Corporation在 intel.com 的电子邮件经过验证
SangHoon ShinPurdue University在 purdue.edu 的电子邮件经过验证