Evaluation of strain rate sensitivity by constant load nanoindentation D Peykov, E Martin, RR Chromik, R Gauvin, M Trudeau Journal of Materials Science 47, 7189-7200, 2012 | 75 | 2012 |
Effects of surface diffusion on high temperature selective emitters D Peykov, YX Yeng, I Celanovic, JD Joannopoulos, CA Schuh Optics express 23 (8), 9979-9993, 2015 | 31 | 2015 |
Variations in nanomechanical properties of back-end Zr–2.5 Nb pressure tube material M Gallaugher, D Peykov, N Brodusch, RR Chromik, L Rodrigue, ... Journal of nuclear materials 442 (1-3), 116-123, 2013 | 13 | 2013 |
Thick sputtered tantalum coatings for high-temperature energy conversion applications V Stelmakh, D Peykov, WR Chan, JJ Senkevich, JD Joannopoulos, ... Journal of Vacuum Science & Technology A 33 (6), 2015 | 9 | 2015 |
Matrix-based approach for the inversion of ARXPS data D Peykov, RW Paynter Journal of Electron Spectroscopy and Related Phenomena 185 (3-4), 103-111, 2012 | 6 | 2012 |
On the choice of tuning parameters for use with Robust GCV, Modified GCV and the Discrepancy Principle in the inversion of ARXPS data D Peykov, RW Paynter Journal of Electron Spectroscopy and Related Phenomena 197, 93-101, 2014 | 4 | 2014 |
Comparison of parameter choice methods for the analytical inversion of ARXPS data D Peykov, RW Paynter Journal of Electron Spectroscopy and Related Phenomena 193, 63-78, 2014 | 2 | 2014 |
The effects of capillarity on photonic crystal selective emitters D Peykov Massachusetts Institute of Technology, 2014 | 2 | 2014 |
Investigation of an iterative matrix method for the inversion of ARXPS data RW Paynter, D Peykov Surface and Interface Analysis 48 (2), 54-63, 2016 | | 2016 |
Deformation of Zirconium Alloys at the Nanoscale D Peykov, E Martin, R Chromik, R Gauvin, M Trudeau | | 2015 |