| Deep-ultraviolet tailored-and low-refractive index antireflection coatings for light-extraction enhancement of light emitting diodes X Yan, M Shatalov, T Saxena, MS Shur Journal of Applied Physics 113 (16), 2013 | 31 | 2013 |
| Development of deep UV LEDs and current problems in material and device technology M Shatalov, R Jain, T Saxena, A Dobrinsky, M Shur Semiconductors and Semimetals 96, 45-83, 2017 | 29 | 2017 |
| 12 kV, 1 cm2 SiC GTO Thyristors with Negative Bevel Termination QJ Zhang, AK Agarwal, C Capell, L Cheng, MJ O'Loughlin, AA Burk, ... Materials Science Forum 717, 1151-1154, 2012 | 29 | 2012 |
| CdS based novel photo-impedance light sensor T Saxena, SL Rumyantsev, PS Dutta, M Shur Semiconductor Science and Technology 29 (2), 025002, 2014 | 27 | 2014 |
| Controlled synthesis of single-crystalline ZnO nanoflakes on arbitrary substrates at ambient conditions PK Vabbina, M Karabiyik, C Al-Amin, N Pala, S Das, W Choi, T Saxena, ... Part. Part. Syst. Charact 31 (2), 190-194, 2014 | 24 | 2014 |
| Optical triggering of 12 kV, 100 A 4H-SiC thyristors SL Rumyantsev, ME Levinshtein, MS Shur, T Saxena, QJ Zhang, ... Semiconductor science and technology 27 (1), 015012, 2011 | 19 | 2011 |
| Microcircuit modeling and simulation beyond Ohm’s law T Saxena, DCY Chek, MLP Tan, VK Arora IEEE Transactions on Education 54 (1), 34-40, 2010 | 19 | 2010 |
| Resistance blow-up effect in micro-circuit engineering MLP Tan, T Saxena, VK Arora Solid-State Electronics 54 (12), 1617-1624, 2010 | 16 | 2010 |
| Towards ultimate scaling of LDMOS with Ultralow Specific On-resistance S Mehrotra, L Radic, B Grote, T Saxena, G Qin, V Khemka, T Thomas, ... 2020 32nd International Symposium on Power Semiconductor Devices and ICs …, 2020 | 12 | 2020 |
| Termination design for trench superjunction power MOSFET G Qin, V Khemka, L Radic, B Grote, T Saxena, M Zitouni US Patent 10,103,257, 2018 | 10 | 2018 |
| Optical triggering of 4H-SiC thyristors (18 kV class) to high currents in purely inductive load circuit SL Rumyantsev, ME Levinshtein, T Saxena, MS Shur, L Cheng, ... Semiconductor Science and Technology 29 (11), 115003, 2014 | 10 | 2014 |
| Low threshold for optical damage in AlGaN epilayers and heterostructures T Saxena, G Tamulaitis, M Shatalov, J Yang, R Gaska, MS Shur Journal of Applied Physics 114 (20), 2013 | 9 | 2013 |
| Spectral dependence of carrier lifetime in high aluminum content AlGaN epitaxial layers T Saxena, S Nargelas, J Mickevičius, O Kravcov, G Tamulaitis, M Shur, ... Journal of Applied Physics 118 (8), 2015 | 8 | 2015 |
| Dynamics of nonequilibrium carrier decay in AlGaN epitaxial layers with high aluminum content T Saxena, M Shur, S Nargelas, Ž Podlipskas, R Aleksiejūnas, ... Optics Express 23 (15), 19646-19655, 2015 | 8 | 2015 |
| Charge balance and UIS robustness of trench field plate power MOSFETs T Saxena, C Torrent, V Khemka, G Qin, M Gibson 2022 IEEE 34th International Symposium on Power Semiconductor Devices and …, 2022 | 6 | 2022 |
| Integrated termination ballast to mitigate avalanche hotspots in trench field plate power MOSFETs T Saxena, C Torrent, V Khemka, G Qin, M Zitouni 2021 33rd International Symposium on Power Semiconductor Devices and ICs …, 2021 | 6 | 2021 |
| Tunable photocapacitive optical radiation sensor enabled radio transmitter and applications thereof T Saxena, PS Dutta, SL Roumiantsev, M Shur US Patent 10,323,980, 2019 | 6 | 2019 |
| Floating body ring termination for trench field plate power MOSFETs T Saxena, V Khemka, B Grote, G Qin, M Zitouni 2020 32nd International Symposium on Power Semiconductor Devices and ICs …, 2020 | 5 | 2020 |
| High current (1225a) optical triggering of 18-kv 4h-SiC thyristor in purely inductive load circuit S Rumyantsev, M Levinshtein, T Saxena, M Shur, L Cheng, J Palmour Materials Science Forum 821, 893-896, 2015 | 5 | 2015 |
| Silicon-on-insulator photoimpedance sensor using capacitance dispersion T Saxena, M Shur IEEE Transactions on Electron Devices 63 (8), 3236-3240, 2016 | 3 | 2016 |
Michael ShurPatricia W. and C. Sheldon Roberts Professor, Rensselaer Polytechnic在 rpi.edu 的电子邮件经过验证
