| Copy number variant analysis of human embryonic stem cells H Wu, KJ Kim, K Mehta, S Paxia, A Sundstrom, T Anantharaman, ... Stem Cells 26 (6), 1484-1489, 2008 | 69 | 2008 |
| Dynamic training for assembly lines MC Putman, V Pinskiy, ES Kim, A Sundstrom US Patent 10,481,579, 2019 | 20 | 2019 |
| Image analysis and length estimation of biomolecules using AFM A Sundstrom, S Cirrone, S Paxia, C Hsueh, R Kjolby, JK Gimzewski, ... IEEE Transactions on Information Technology in Biomedicine, 2012 | 18 | 2012 |
| What can information-asymmetric games tell us about the context of Crick's ‘frozen accident’? J Jee, A Sundstrom, SE Massey, B Mishra Journal of the Royal Society Interface 10 (88), 20130614, 2013 | 15 | 2013 |
| Identifying individual DNA species in a complex mixture by precisely measuring the spacing between nicking restriction enzymes with atomic force microscope J Reed, C Hsueh, ML Lam, R Kjolby, A Sundstrom, B Mishra, ... Journal of the Royal Society Interface, 2012 | 15 | 2012 |
| Histological image processing features induce a quantitative characterization of chronic tumor hypoxia A Sundstrom, E Grabocka, D Bar-Sagi, B Mishra PloS one 11 (4), e0153623, 2016 | 13 | 2016 |
| Assembly error correction for assembly lines MC Putman, V Pinskiy, ES Kim, A Sundstrom US Patent 11,209,795, 2021 | 9 | 2021 |
| Methods and systems for measuring a property of a macromolecule JC Reed, B Mishra, A Sundstrom US Patent 9,995,766, 2018 | 7 | 2018 |
| Dynamic training for assembly lines MC Putman, V Pinskiy, ES Kim, A Sundstrom US Patent 11,156,982, 2021 | 5 | 2021 |
| Systems, Methods, and Media for Manufacturing Processes A Sundstrom, ES Kim, D Limoge, V Pinskiy, MC Putman US Patent App. 17/304,349, 2021 | 4 | 2021 |
| Method, systems and apparatus for intelligently emulating factory control systems and simulating response data MC Putman, JB Putman, V Pinskiy, A Sundstrom, J Williams III US Patent 11,086,988, 2021 | 4 | 2021 |
| Simulating heterogeneous tumor cell populations A Sundstrom, D Bar-Sagi, B Mishra Plos one 11 (12), e0168984, 2016 | 4 | 2016 |
| Defect detection system T Ivanov, D Babeshko, V Pinskiy, MC Putman, A Sundstrom US Patent 11,416,711, 2022 | 3 | 2022 |
| Dynamic monitoring and securing of factory processes, equipment and automated systems MC Putman, JB Putman, V Pinskiy, D Limoge, A Sundstrom, J Williams III US Patent 11,100,221, 2021 | 3 | 2021 |
| Systems, Methods, and Media for Manufacturing Processes MC Putman, V Pinskiy, A Sundstrom, AR Nirmaleswaran, ES Kim US Patent App. 17/195,746, 2021 | 3 | 2021 |
| Systems, Methods, and Media for Manufacturing Processes A Sundstrom, D Limoge, ES Kim, V Pinskiy, MC Putman US Patent App. 17/091,393, 2021 | 3 | 2021 |
| Measuring biomolecules: an image processing and length estimation pipeline using atomic force microscopy to measure DNA and RNA with high precision A Sundstrom Master's Thesis. New York University. Available at, 2008 | 3 | 2008 |
| System and method for improving assembly line processes MC Putman, V Pinskiy, ES Kim, A Sundstrom US Patent 11,675,330, 2023 | 2 | 2023 |
| Dynamic monitoring and securing of factory processes, equipment and automated systems MC Putman, JB Putman, V Pinskiy, D Limoge, A Sundstrom, J Williams III US Patent 11,063,965, 2021 | 2 | 2021 |
| Defending industrial production using AI process control D Limoge, A Sunstrom, V Pinskiy, M Putman 2020 IEEE Systems Security Symposium (SSS), 1-4, 2020 | 2 | 2020 |
Bud MishraProfessor of Computer Science and Mathematics在 nyu.edu 的电子邮件经过验证
