Above room temperature ferromagnetism in Mn-ion implanted Si M Bolduc, C Awo-Affouda, A Stollenwerk, MB Huang, FG Ramos, ... Physical Review B 71 (3), 033302, 2005 | 339 | 2005 |
Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope MR Hummon, AJ Stollenwerk, V Narayanamurti, PO Anikeeva, MJ Panzer, ... Physical Review B 81 (11), 115439, 2010 | 63 | 2010 |
Electronic structure changes of from subsurface Mn observed by STM MR Krause, AJ Stollenwerk, J Reed, VP LaBella, M Hortamani, P Kratzer, ... Physical Review B 75 (20), 205326, 2007 | 34 | 2007 |
Combined molecular beam epitaxy low temperature scanning tunneling microscopy system: Enabling atomic scale characterization of semiconductor surfaces and interfaces M Krause, A Stollenwerk, C Awo-Affouda, B Maclean, VP LaBella Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005 | 31 | 2005 |
Ballistic electron microscopy and spectroscopy of metal and semiconductor nanostructures W Yi, AJ Stollenwerk, V Narayanamurti Surface Science Reports 64 (5), 169-190, 2009 | 30 | 2009 |
Ostwald ripening of manganese silicide islands on Si (001) MR Krause, A Stollenwerk, M Licurse, VP LaBella Journal of Vacuum Science & Technology A 24 (4), 1480-1483, 2006 | 23 | 2006 |
Influence of interface coupling on the electronic properties of the Au/MoS 2 junction M Cook, R Palandech, K Doore, Z Ye, G Ye, R He, AJ Stollenwerk Physical Review B 92 (20), 201302, 2015 | 16 | 2015 |
Effect of interface band structure on hot-electron attenuation lengths in Au thin films AJ Stollenwerk, EJ Spadafora, JJ Garramone, RJ Matyi, RL Moore, ... Physical Review B 77 (3), 033416, 2008 | 14 | 2008 |
Investigation of the structural properties of ferromagnetic Mn-implanted Si M Bolduc, C Awo-Affouda, A Stollenwerk, MB Huang, F Ramos, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2006 | 14 | 2006 |
Three-dimensional quantum size effects on the growth of Au islands on MoS2 TE Kidd, J Weber, R Holzapfel, K Doore, AJ Stollenwerk Applied Physics Letters 113 (19), 2018 | 11 | 2018 |
Measurement of the clustering energy for manganese silicide islands on Si (001) by Ostwald ripening MR Krause, AJ Stollenwerk, M Licurse, VP LaBella Applied Physics Letters 91 (4), 2007 | 9 | 2007 |
Chemical substitution induced half-metallicity in CrMnSb (1− x) Px E O’Leary, A Ramker, D VanBrogen, B Dahal, EJ Montgomery, S Poddar, ... Journal of Applied Physics 128 (11), 2020 | 8 | 2020 |
Hot electron transport across manganese silicide layers on the Si (001) surface AJ Stollenwerk, MR Krause, R Moore, VP LaBella Journal of Vacuum Science & Technology A 24 (4), 1610-1612, 2006 | 8 | 2006 |
Measuring spin dependent hot electron transport through a metal-semiconductor interface using spin-polarized ballistic electron emission microscopy AJ Stollenwerk, MR Krause, JJ Garramone, EJ Spadafora, VP LaBella Physical Review B 76 (19), 195311, 2007 | 7 | 2007 |
Probing the hot-electron transport properties and interface band structure of (001) and (001) Schottky diodes AJ Stollenwerk, MR Krause, DH Idell, R Moore, VP LaBella Physical Review B 74 (15), 155328, 2006 | 7 | 2006 |
Ballistic electron transport properties of Fe-based films on Si (001) AJ Stollenwerk, MR Krause, DH Idell, R Moore, VP LaBella Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2006 | 7 | 2006 |
Electronic growth of Pd (111) nanostructures on MoS2 TE Kidd, S Scott, S Roberts, R Carlile, PV Lukashev, AJ Stollenwerk Journal of Applied Physics 129 (17), 2021 | 6 | 2021 |
Effect of growth temperature on ballistic electron transport through the Au/Si (001) interface MW Eckes, BE Friend, AJ Stollenwerk Journal of Applied Physics 115 (16), 2014 | 6 | 2014 |
Preparation of ultrathin gold films with subatomic surface roughness TE Kidd, J Weber, E O’Leary, AJ Stollenwerk Langmuir 37 (31), 9472-9477, 2021 | 5 | 2021 |
Self-assembled Ag (111) nanostructures induced by Fermi surface nesting TE Kidd, E O’Leary, A Anderson, S Scott, AJ Stollenwerk Physical Review B 100 (23), 235447, 2019 | 5 | 2019 |