| Scalable production of graphene inks via wet‐jet milling exfoliation for screen‐printed micro‐supercapacitors S Bellani, E Petroni, AE Del Rio Castillo, N Curreli, B Martín‐García, ... Advanced Functional Materials 29 (14), 1807659, 2019 | 234 | 2019 |
| Liquid‐phase exfoliated indium–selenide flakes and their application in hydrogen evolution reaction E Petroni, E Lago, S Bellani, DW Boukhvalov, A Politano, B Gürbulak, ... Small 14 (26), 1800749, 2018 | 110 | 2018 |
| Controlled micro/nanodome formation in proton‐irradiated bulk transition‐metal dichalcogenides D Tedeschi, E Blundo, M Felici, G Pettinari, B Liu, T Yildrim, E Petroni, ... Advanced Materials 31 (44), 1903795, 2019 | 94 | 2019 |
| Liquid phase exfoliated indium selenide based highly sensitive photodetectors N Curreli, M Serri, D Spirito, E Lago, E Petroni, B Martín‐García, ... Advanced Functional Materials 30 (13), 1908427, 2020 | 64 | 2020 |
| Material and process engineering challenges in Ge-rich GST for embedded PCM A Redaelli, E Petroni, R Annunziata Materials Science in Semiconductor Processing 137, 106184, 2022 | 30 | 2022 |
| Metrics for quantification of by-process segregation in Ge-rich GST E Petroni, A Serafini, D Codegoni, P Targa, L Mariani, M Scuderi, ... Frontiers in Physics 10, 862954, 2022 | 11 | 2022 |
| Modeling of virgin state and forming operation in embedded phase change memory (PCM) M Baldo, O Melnic, M Scuderi, G Nicotra, M Borghi, E Petroni, A Motta, ... 2020 IEEE International Electron Devices Meeting (IEDM), 13.3. 1-13.3. 4, 2020 | 11 | 2020 |
| Improving Ge-rich GST ePCM reliability through BEOL engineering A Redaelli, A Gandolfo, G Samanni, E Gomiero, E Petroni, L Scotti, ... ESSDERC 2021-IEEE 51st European Solid-State Device Research Conference …, 2021 | 6 | 2021 |
| BEOL process effects on ePCM reliability A Redaelli, A Gandolfo, G Samanni, E Gomiero, E Petroni, L Scotti, ... IEEE Journal of the Electron Devices Society 10, 563-568, 2022 | 5 | 2022 |
| R. Oropesa-Nu nez, M. Prato, F. Bonaccorso, Scalable production of graphene inks via wet-jet milling exfoliation for screen-printed micro-supercapacitors S Bellani, E Petroni, AEDR Castillo, N Curreli, B Martín-García Adv. Funct. Mater 29, 14, 2019 | 5 | 2019 |
| Advanced Metrics for Quantification of By‐Process Segregation beyond Ternary Systems E Petroni, M Patelmo, A Serafini, D Codegoni, L Laurin, M Baldo, ... physica status solidi (RRL)–Rapid Research Letters 17 (8), 2200458, 2023 | 4 | 2023 |
| Unveiling Retention Physical Mechanism of Ge-rich GST ePCM Technology L Laurin, M Baldo, E Petroni, G Samanni, L Turconi, A Motta, M Borghi, ... 2023 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2023 | 2 | 2023 |
| Interaction between forming pulse and integration process flow in ePCM M Baldo, E Petroni, L Laurin, G Samanni, O Melnic, D Ielmini, A Redaelli 2022 17th Conference on Ph. D Research in Microelectronics and Electronics …, 2022 | 2 | 2022 |
| Modeling environment for Ge-rich GST phase change memory cells M Baldo, L Laurin, E Petroni, G Samanni, M Allegra, E Gomiero, D Ielmini, ... 2022 IEEE International Memory Workshop (IMW), 1-4, 2022 | 2 | 2022 |
| Heater system optimization for robust ePCM reliability and scalability in 28nm FDSOI technology R Ranica, R Berthelon, A Gandolfo, G Samanni, E Gomiero, J Jasse, ... 2021 IEEE International Electron Devices Meeting (IEDM), 28.1. 1-28.1. 4, 2021 | 2 | 2021 |
| Thermo-desorption measurements during N-doped Ge-rich Ge2Sb2Te5 crystallization J Remondina, A Portavoce, M Bertoglio, G Roland, E Petroni, D Benoit, ... Nanotechnology 34 (28), 285702, 2023 | 1 | 2023 |
| Modeling and Analysis of Virgin Ge-Rich GST Embedded Phase Change Memories M Baldo, O Melnic, M Scudieri, G Nicotra, M Borghi, E Petroni, A Motta, ... IEEE Transactions on Electron Devices 70 (3), 1055-1060, 2023 | 1 | 2023 |
| Exploring the evolution of mass density and thickness of N-doped Ge-rich GeSbTe during multistep crystallization J Remondina, A Portavoce, Y Le Friec, D Benoit, E Petroni, M Putero Scientific Reports 14 (1), 14677, 2024 | | 2024 |
| Study of Ge‐Rich Ge–Sb–Te Device‐Dependent Segregation for Industrial Grade Embedded Phase‐Change Memory E Petroni, M Allegra, M Baldo, L Laurin, A Serafini, L Favennec, ... physica status solidi (RRL)–Rapid Research Letters, 2300449, 2024 | | 2024 |
| TCAD Modeling of Germanium Behavior During Forming Operation in Ge-Rich ePCM M Baldo, L Laurin, E Petroni, C Pavesi, A Motta, D Ielmini, R Annunziata, ... 2023 International Conference on Simulation of Semiconductor Processes and …, 2023 | | 2023 |
