| Nuclear energy: An introduction to the concepts, systems, and applications of nuclear processes RL Murray, KE Holbert Elsevier, 2014 | 471 | 2014 |
| Embedding remote experimentation in power engineering education MM Albu, KE Holbert, GT Heydt, SD Grigorescu, V Trusca IEEE Transactions on Power Systems 19 (1), 139-143, 2004 | 144 | 2004 |
| Mechanisms of enhanced radiation-induced degradation due to excess molecular hydrogen in bipolar oxides XJ Chen, HJ Barnaby, B Vermeire, K Holbert, D Wright, RL Pease, ... IEEE Transactions on Nuclear Science 54 (6), 1913-1919, 2007 | 104 | 2007 |
| Enhanced TID susceptibility in sub-100 nm bulk CMOS I/O transistors and circuits M McLain, HJ Barnaby, KE Holbert, RD Schrimpf, H Shah, A Amort, ... IEEE Transactions on Nuclear Science 54 (6), 2210-2217, 2007 | 104 | 2007 |
| Strategies, challenges and prospects for active learning in the computer-based classroom KE Holbert, GG Karady IEEE transactions on education 52 (1), 31-38, 2008 | 99 | 2008 |
| The effects of hydrogen on the enhanced low dose rate sensitivity (ELDRS) of bipolar linear circuits RL Pease, PC Adell, BG Rax, XJ Chen, HJ Barnaby, KE Holbert, ... IEEE Transactions on Nuclear Science 55 (6), 3169-3173, 2008 | 84 | 2008 |
| Total ionizing dose effect of γ-ray radiation on the switching characteristics and filament stability of HfOx resistive random access memory R Fang, Y Gonzalez Velo, W Chen, KE Holbert, MN Kozicki, H Barnaby, ... Applied Physics Letters 104 (18), 2014 | 82 | 2014 |
| Prospects for dynamic transmission circuit ratings KE Holbert, GT Heydt ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems …, 2001 | 71 | 2001 |
| Optimizing radiation hard by design SRAM cells LT Clark, KC Mohr, KE Holbert, X Yao, J Knudsen, H Shah IEEE transactions on nuclear science 54 (6), 2028-2036, 2007 | 66 | 2007 |
| Use of satellite technologies for power system measurements, command, and control KE Holbert, GI Heydt, H Ni Proceedings of the IEEE 93 (5), 947-955, 2005 | 63 | 2005 |
| Electrical energy conversion and transport: an interactive computer-based approach GG Karady, KE Holbert John Wiley & Sons, 2013 | 57 | 2013 |
| Nonlinear dynamic modeling and simulation of a passively cooled small modular reactor SE Arda, KE Holbert Progress in Nuclear Energy 91, 116-131, 2016 | 49 | 2016 |
| Total-ionizing-dose effects on the resistance switching characteristics of chalcogenide programmable metallization cells Y Gonzalez-Velo, HJ Barnaby, MN Kozicki, P Dandamudi, A Chandran, ... IEEE Transactions on Nuclear science 60 (6), 4563-4569, 2013 | 47 | 2013 |
| Modeling inter-device leakage in 90 nm bulk CMOS devices IS Esqueda, HJ Barnaby, KE Holbert, Y Boulghassoul IEEE Transactions on Nuclear Science 58 (3), 793-799, 2011 | 46 | 2011 |
| Modeling of ionizing radiation-induced degradation in multiple gate field effect transistors IS Esqueda, HJ Barnaby, KE Holbert, F El-Mamouni, RD Schrimpf IEEE Transactions on Nuclear Science 58 (2), 499-505, 2011 | 46 | 2011 |
| Redundant sensor validation by using fuzzy logic KE Holbert, AS Heger, NK Alang-Rashid Nuclear Science and Engineering 118 (1), 54-64, 1994 | 44 | 1994 |
| Total ionizing dose retention capability of conductive bridging random access memory Y Gonzalez-Velo, HJ Barnaby, MN Kozicki, C Gopalan, K Holbert IEEE Electron Device Letters 35 (2), 205-207, 2014 | 43 | 2014 |
| Modeling the dose rate response and the effects of hydrogen in bipolar technologies XJ Chen, HJ Barnaby, P Adell, RL Pease, B Vermeire, KE Holbert IEEE Transactions on Nuclear Science 56 (6), 3196-3202, 2009 | 43 | 2009 |
| Gamma radiation effects on indium-zinc oxide thin-film transistors A Indluru, KE Holbert, TL Alford Thin Solid Films 539, 342-344, 2013 | 42 | 2013 |
| The impact of total ionizing dose on unhardened SRAM cell margins X Yao, N Hindman, LT Clark, KE Holbert, DR Alexander, WM Shedd IEEE Transactions on Nuclear Science 55 (6), 3280-3287, 2008 | 42 | 2008 |
