Methods for photoacoustic signal measurement, rectification, and analysis for 85 μm thin Si
samples in the 20-20 000 Hz modulation frequency range are presented. Methods for
frequency-dependent amplitude and phase signal rectification in the presence of coherent
and incoherent noise as well as distortion due to microphone characteristics are presented.
Signal correction is accomplished using inverse system response functions deduced by
comparing real to ideal signals for a sample with well-known bulk parameters and …