Identification of genetic loci for flag-leaf-related traits in wheat (Triticum aestivum L.) and their effects on grain yield

Y Wang, L Qiao, C Yang, X Li, J Zhao, B Wu… - Frontiers in Plant …, 2022 - frontiersin.org
Flag-leaf-related traits including length (FLL), width (FLW), area (FLA), thickness (FLT), and
volume (FLV) of flag leaves are the most important determinants of plant architecture and
yield in wheat. Understanding the genetic basis of these traits could accelerate the breeding
of high yield wheat varieties. In this study, we constructed a doubled haploid (DH)
population and analyzed flag-leaf-related traits in five experimental locations/years using the
wheat 90K single-nucleotide polymorphism array. It's worth noting that a novel method was …

Identification of genetic loci for flag leaf traits in wheat (Triticumaestivum L.)

Y Xu, J Zhao, M Kai, B Wu, MMU Helal, J Zheng - Euphytica, 2024 - Springer
The flag leaf size of wheat is an “ideotypic” morphological trait that plays a critical role in
plant architecture and grain yield by providing photosynthetic assimilates in wheat. Although
many of the genomics research studies covered the flag leaf traits, including flag leaf length
(FLL), width (FLW), area (FLA), thickness (FLT), and volume (FLV), for a better
understanding, this research used a recombinant inbred line (RIL) population derived from a
cross between DH118 and Jinmai 919 to evaluate the genetic regions across six …
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