… EDA tool challenges for power-related problems by (i) … the impact of temperature on circuit
performance and reliability. The … emissivity variations that change the die surface temperature …

… IC industry is driving into the era of dark silicon, in which only a … the bulk that leads to higher
local temperatures. This is the so-… ’s point of view, we briefly addressed the challenges and …

… strong challenges in terms of cost, speed and reliability. For … mentioned previously (devices,
low temperature circuits [29][30]… different from the digital one, and has its specific challenges. …

… The EDA challenges in the dark silicon era: Temperature, reliability, and variability perspectives.
In Proceedings of the 51st Annual Design Automation Conference, Francisco, CA, USA, …

… Marculescu, “The EDA challenges in the dark silicon era: Temperature, reliability, and
variability perspectives,” in Proceedings of the 51st Annual Design Automation Conference, pp. 1–…

… To address power limitation issues in dark silicon era for multi-core systems-on-chip and …
Temperature, reliability, and variability challenges in the dark silicon era have been presented …

… and the processor is under-designed from reliability perspective, saving in cost with a …
EDA challenges in the dark silicon era: Temperature, reliability, and variability perspectives, …

… Article Views are the COUNTER-compliant sum of full text … Depending on the temperature of
the silicon surface, monohydride, … This was a key advance as stable and reliable imaging on …

… and the processor is under-designed from reliability perspective, saving in cost with a …
EDA challenges in the dark silicon era: Temperature, reliability, and variability perspectives, …

… EDA problems and solutions while still maintaining privacy of user inputs and IPs. … , voltage,
and temperature (PVT) variations. This has made the design of reliable analog circuits very …