Key message A major stable QTL for flag leaf width was narrowed down to 2.5 Mb region
containing two predicated putative candidate genes, and its effects on yield-related traits …

Flag leaf-related traits (FLRTs) are determinant traits affecting plant architecture and yield
potential in wheat (Triticum aestivum L.). In this study, a recombinant inbred line population …

Flag leaf angle (FLANG) is closely related to crop architecture and yield. We previously
identified the quantitative trait locus (QTL) QFLANG-4B for FLANG on chromosome 4B …

The flag leaf is the main organ of photosynthesis during grain-filling period of wheat, and
flag leaf-related traits affect plant morphology and yield potential. In this study, two BC3F6 …

Flag leaf-related traits (FLRTs) are determinant traits affecting plant architecture and yield
potential in wheat (Triticum aestivum L.). In this study, three related recombinant inbred line …

Introduction Flag leaf width (FLW) is directly related to photosynthetic capacity and yield
potential in wheat. In a previous study, Qflw. nau-5A controlling FLW was detected on …

Flag leaf size is a crucial trait influencing plant architecture and yield potential in wheat. A
recombinant inbred line (RIL) population derived from the cross of W7268 and Chuanyu 12 …

The flag leaf is an important photosynthetic organ of wheat (Triticum aestivum L.).
Appropriate flag leaf size can effectively increase grain yield. In this study, a tetraploid wheat …

Flag leaves, plant height (PH), and spike-related traits are key determinants contributing to
yield potential in wheat. In this study, we developed a recombinant inbred line (RIL) …

Key message QTL controlling flag leaf length, flag leaf width, flag leaf area and flag leaf
angle were mapped in wheat. Abstract This study aimed to advance our understanding of …