Leaf traits (leaf length, width, and area) are closely associated with photosynthetic ability
and grain yield in bread wheat (Triticum aestivum L.). Identifying QTLs that control leaf …

Leaf size is an important factor contributing to the photosynthetic capability of wheat plants. It
also significantly affects various agronomic traits. In particular, the flag leaves contribute …

Flag leaf-related traits (FLRTs) are determinant traits affecting plant architecture and yield
potential in wheat (Triticum aestivum L.). In this study, three related recombinant inbred line …

Flag leaf-related traits (FLRTs) are determinant traits affecting plant architecture and yield
potential in wheat (Triticum aestivum L.). In this study, a recombinant inbred line population …

Flag-leaf-related traits including length (FLL), width (FLW), area (FLA), thickness (FLT), and
volume (FLV) of flag leaves are the most important determinants of plant architecture and …

Key message QTL controlling flag leaf length, flag leaf width, flag leaf area and flag leaf
angle were mapped in wheat. Abstract This study aimed to advance our understanding of …

Key message Major and environmentally stable QTL for flag leaf-related traits in wheat were
identified and validated across ten environments using six populations with different genetic …

Flag leaf traits influence wheat yield by affecting photosynthetic capacity and plant
architecture. In this study, flag leaf traits over 4 years in Chinese common wheat were …

Flag leaves, plant height (PH), and spike-related traits are key determinants contributing to
yield potential in wheat. In this study, we developed a recombinant inbred line (RIL) …

In bread wheat, QTL interval mapping for four growth characters (early growth habit, days to
heading, days to maturity and plant height), and association studies for two leaf characters …