Degradation assessment in IGBT modules using four-point probing approach

KB Pedersen, PK Kristensen, V Popok… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
Four-point probing of electrical parameters on various components of IGBT modules is
suggested as an approach for the estimation of degradation in stressed devices. By …
被引用次数：43 相关文章
[PDF] academia.edu

[PDF][PDF] Degradation Assessment in IGBT Modules using Four-Point Probing Approach

KB Pedersen, PK Kristensen, V Popok, K Pedersen - academia.edu
Four-point probing of electrical parameters on various components of IGBT modules is
suggested as approach for estimation of degradation in stressed devices. By comparison of …

[引用][C] Degradation Assessment in IGBT Modules Using Four-Point Probing Approach

KB Pedersen, PK Kristensen… - … on Power Electronics, 2015 - ui.adsabs.harvard.edu
Degradation Assessment in IGBT Modules Using Four-Point Probing Approach - NASA/ADS
Now on home page ads icon ads Enable full ADS view NASA/ADS Degradation Assessment in …

Degradation Assessment in IGBT Modules Using Four-Point Probing Approach

KB Pedersen, PK Kristensen, V Popok… - IEEE Transactions on …, 2015 - infona.pl
Four-point probing of electrical parameters on various components of IGBT modules is
suggested as an approach for the estimation of degradation in stressed devices. By …

Degradation Assessment in IGBT Modules Using Four-Point Probing Approach

KB Pedersen, PK Kristensen, V Popok… - IEEE Transactions on …, 2015 - vbn.aau.dk
Four-point probing of electrical parameters on various components of IGBT modules is
suggested as an approach for the estimation of degradation in stressed devices. By …
[PDF] researchgate.net

[PDF][PDF] Degradation Assessment in IGBT Modules using Four-Point Probing Approach

KB Pedersen, PK Kristensen, V Popok, K Pedersen - researchgate.net
Four-point probing of electrical parameters on various components of IGBT modules is
suggested as approach for estimation of degradation in stressed devices. By comparison of …