[HTML][HTML] Development of adaptive point-spread function estimation method in various scintillation detector thickness for X-ray imaging
BK Cha, Y Lee, K Kim - Sensors, 2023 - mdpi.com
An indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging
BK Cha, Y Lee, K Kim - 2023 - scholarworks.bwise.kr
An indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging
BK Cha, Y Lee, K Kim - Sensors, 2023 - ui.adsabs.harvard.edu
An indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging
BK Cha, Y Lee, K Kim - Sensors (Basel, Switzerland), 2023 - pubmed.ncbi.nlm.nih.gov
An indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging.
BK Cha, Y Lee, K Kim - Sensors (Basel, Switzerland), 2023 - europepmc.org
An indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
[HTML][HTML] Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging
BK Cha, Y Lee, K Kim - Sensors (Basel, Switzerland), 2023 - ncbi.nlm.nih.gov
An indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging
BK Cha, Y Lee, K Kim - Sensors, 2023 - search.proquest.com
An indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
Development of Adaptive Point-Spread Function Estimation Method in Various Scintillation Detector Thickness for X-ray Imaging.
BK Cha, Y Lee, K Kim - Sensors (14248220), 2023 - search.ebscohost.com
An indirect conversion X-ray detector uses a scintillator that utilizes the proportionality of the
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …
intensity of incident radiation to the amount of visible light emitted. A thicker scintillator …