Towards the low-dose characterization of beam sensitive nanostructures via implementation of sparse image acquisition in scanning transmission electron microscopy

S Hwang, CW Han, SV Venkatakrishnan… - Measurement …, 2017 - iopscience.iop.org
Scanning transmission electron microscopy (STEM) has been successfully utilized to
investigate atomic structure and chemistry of materials with atomic resolution. However …

Towards the low-dose characterization of beam sensitive nanostructures via implementation of sparse image acquisition in scanning transmission electron microscopy

S Hwang, CW Han, V Ortalan… - Measurement Science …, 2017 - inis.iaea.org
[en] Scanning transmission electron microscopy (STEM) has been successfully utilized to
investigate atomic structure and chemistry of materials with atomic resolution. However …

Towards the low-dose characterization of beam sensitive nanostructures via implementation of sparse image acquisition in scanning transmission electron microscopy

S Hwang, CW Han… - Measurement …, 2017 - ui.adsabs.harvard.edu
Scanning transmission electron microscopy (STEM) has been successfully utilized to
investigate atomic structure and chemistry of materials with atomic resolution. However …

[PDF][PDF] Towards the low-dose characterization of beam sensitive nanostructures via implementation of sparse image acquisition in scanning transmission electron …

S Hwang, CW Han, SV Venkatakrishnan… - Meas. Sci …, 2017 - engineering.purdue.edu
Scanning transmission electron microscopy (STEM) has been successfully utilized to
investigate atomic structure and chemistry of materials with atomic resolution. However …