Ellipsometric study of refractive index anisotropy in porous silicon

H Krzyżanowska, J Żuk - Journal of luminescence, 1998 - Elsevier
Porous Si layers of different thicknesses were prepared by anodising p+-type Si substrates
with a resistivity of 0.01 Ωcm. The porosity of the samples ranged from 23% to 62%. The …
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[引用][C] Ellipsometric study of refractive index anisotropy in porous silicon

H Krzyzanowska - Journal of Luminescence, 1998 - ui.adsabs.harvard.edu
Ellipsometric study of refractive index anisotropy in porous silicon - NASA/ADS Now on home
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[引用][C] Ellipsometric study of refractive index anisotropy in porous silicon

H KRZYZANOWSKA, M KULIK… - Journal of …, 1998 - pascal-francis.inist.fr
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Ellipsometric study of refractive index anisotropy in porous silicon

H Krzyzanowska, M Kulik, J Zuk - Journal of Luminescence, 1998 - elibrary.ru
Porous Si layers of different thicknesses were prepared by anodising p+-type Si substrates
with a resistivity of 0.01 Ωcm. The porosity of the samples ranged from 23% to 62%. The …

Ellipsometric study of refractive index anisotropy in porous silicon

HT Krzyżanowska, M Kulik, JA Żuk - Journal of Luminescence, 1998 - bazawiedzy.umcs.pl
Porous Si layers of different thicknesses were prepared by anodising p+-type Si substrates
with a resistivity of 0.01 Ω cm. The porosity of the samples ranged from 23% to 62%. The …

[引用][C] Ellipsometric study of refractive index anisotropy in porous silicon

H Krzyżanowska, M Kulik, J Żuk - Journal of Luminescence, 1998 - cir.nii.ac.jp
Ellipsometric study of refractive index anisotropy in porous silicon | CiNii Research CiNii 国立
情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データをさがす …

Ellipsometric study of refractive index anisotropy in porous silicon

HT Krzyżanowska, M Kulik, JA Żuk - Journal of Luminescence, 1998 - bazawiedzy.umcs.pl
Porous Si layers of different thicknesses were prepared by anodising p+-type Si substrates
with a resistivity of 0.01 Ω cm. The porosity of the samples ranged from 23% to 62%. The …

[引用][C] Ellipsometric study of refractive index anisotropy in porous silicon

H KRZYZANOWSKA, M KULIK, J ZUK - Journal of luminescence, 1998 - Elsevier