Secondary ion mass spectrometry: characterizing complex samples in two and three dimensions

JS Fletcher, JC Vickerman - Analytical chemistry, 2013 - ACS Publications
Over the last 10 or so years, developments in molecular se-condary ion mass spectrometry
(SIMS) have taken its capability into areas previously only demonstrated in dynamic SIMS …
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[引用][C] Secondary ion mass spectrometry: characterizing complex samples in two and three dimensions.

JS Fletcher, JC Vickerman - Analytical Chemistry, 2012 - europepmc.org
Secondary ion mass spectrometry: characterizing complex samples in two and three
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[引用][C] Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three Dimensions

JS Fletcher, JC Vickerman - Analytical Chemistry, 2012 - cir.nii.ac.jp
Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three
Dimensions | CiNii Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 …

[引用][C] Secondary ion mass spectrometry: characterizing complex samples in two and three dimensions

JS Fletcher, JC Vickerman - Analytical chemistry, 2013 - pubmed.ncbi.nlm.nih.gov