Speckle-based at-wavelength metrology of X-ray optics at Diamond Light Source

H Wang, T Zhou, Y Kashyap… - … Methods for X-Ray …, 2017 - spiedigitallibrary.org
To achieve high resolution and sensitivity on the nanometer scale, further development of X-
ray optics is required. Although ex-situ metrology provides valuable information about X-ray …
被引用次数：8 相关文章

Speckle-based at-wavelength metrology of x-ray optics at Diamond Light Source

H Wang, T Zhou, Y Kashyap, K Sawhney - Proc. of SPIE Vol - spiedigitallibrary.org
To achieve high resolution and sensitivity on the nanometer scale, further development of X-
ray optics is required. Although ex-situ metrology provides valuable information about X-ray …
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[PDF][PDF] Speckle-based at-wavelength metrology of x-ray optics at Diamond Light Source

H Wang, T Zhou, Y Kashyap, K Sawhney - Proc. of SPIE Vol - scholar.archive.org
To achieve high resolution and sensitivity on the nanometer scale, further development of X-
ray optics is required. Although ex-situ metrology provides valuable information about X-ray …

Speckle-based at-wavelength metrology of x-ray optics at Diamond Light Source

H Wang, T Zhou, Y Kashyap… - Society of Photo-Optical …, 2017 - ui.adsabs.harvard.edu
To achieve high resolution and sensitivity on the nanometer scale, further development of X-
ray optics is required. Although ex-situ metrology provides valuable information about X-ray …