Performance and hot-carrier effects of small CRYO-CMOS devices

IEEE transactions on electron devices, 1987 - ieeexplore.ieee.org
The performance characteristics of submicrometer CMOS devices operating at
low/cryogenic temperatures (CRYO-CMOS) are determined. The advantages and problems …
被引用次数：100 相关文章

[引用][C] Performance and Hot-Carrier Effects of Small CRYO-CMOS Devices

M AOKI - IEEE Trans. Electron Devices, 1987 - cir.nii.ac.jp
Performance and Hot-Carrier Effects of Small CRYO-CMOS Devices | CiNii Research CiNii
国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データを …

Performance and hot-carrier effects of small CRYO-CMOS devices

M Aoki, S Hanamura, T Masuhara… - IEEE Transactions on …, 1987 - ui.adsabs.harvard.edu
The performance characteristics and hot-carrier effects of low/cryogenic temperature
submicrometer CMOS devices (CRO-CMOS) with scaled-down oxide thicknesses are …

[引用][C] Performance and hot-carrier effects of small CRYO-CMOS devices

M AOKI, S HANAMURA… - IEEE transactions on …, 1987 - pascal-francis.inist.fr
Performance and hot-carrier effects of small CRYO-CMOS devices CNRS Inist Pascal-Francis
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[引用][C] Performance and hot-carrier effects of small CRYO-CMOS devices

M Aoki, S Hanamura, T Masuhara, K Yano - IEEE Transactions on …, 1987 - cir.nii.ac.jp
Performance and hot-carrier effects of small CRYO-CMOS devices | CiNii Research CiNii 国立
情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データをさがす …