[HTML][HTML] Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography
BK Cha, KH Lee, Y Lee, K Kim - Sensors, 2023 - mdpi.com
The resulting image obtained from an X-ray imaging system depends significantly on the
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
[PDF][PDF] Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography
BK Cha, KH Lee, Y Lee, K Kim - Sensors - pdfs.semanticscholar.org
The resulting image obtained from an X-ray imaging system depends significantly on the
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography
BK Cha, KH Lee, Y Lee, K Kim - 2023 - scholarworks.bwise.kr
The resulting image obtained from an X-ray imaging system depends significantly on the
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography
BK Cha, KH Lee, Y Lee, K Kim - Sensors, 2023 - ui.adsabs.harvard.edu
The resulting image obtained from an X-ray imaging system depends significantly on the
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography.
BK Cha, KH Lee, Y Lee, K Kim - Sensors (14248220), 2023 - search.ebscohost.com
The resulting image obtained from an X-ray imaging system depends significantly on the
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography.
BK Cha, KH Lee, Y Lee, K Kim - Sensors (Basel, Switzerland), 2023 - europepmc.org
The resulting image obtained from an X-ray imaging system depends significantly on the
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography
BK Cha, KH Lee, Y Lee, K Kim - Sensors, 2023 - search.proquest.com
The resulting image obtained from an X-ray imaging system depends significantly on the
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
[HTML][HTML] Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography
BK Cha, KH Lee, Y Lee, K Kim - Sensors (Basel, Switzerland), 2023 - ncbi.nlm.nih.gov
The resulting image obtained from an X-ray imaging system depends significantly on the
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography
BK Cha, KH Lee, Y Lee, K Kim - Sensors (Basel …, 2023 - pubmed.ncbi.nlm.nih.gov
The resulting image obtained from an X-ray imaging system depends significantly on the
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography.
BK Cha, KH Lee, Y Lee, K Kim - Sensors (Basel, Switzerland), 2023 - europepmc.org
The resulting image obtained from an X-ray imaging system depends significantly on the
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …
characteristics of the detector. In particular, when an X-ray image is acquired by thinning the …