Confocal Raman microscopy: how to correct depth profiles considering diffraction and refraction effects

A Gallardo, S Spells, R Navarro… - Journal of Raman …, 2007 - Wiley Online Library
A new approach to obtain corrected depth profiles by confocal Raman microscopy, which
considers diffraction and refraction effects is presented. The problem of diffraction effects …

Confocal Raman microscopy: how to correct depth profiles considering diffraction and refraction effects

A Gallardo, SJ Spells, R Navarro… - Journal of Raman …, 2007 - shura.shu.ac.uk
A new approach to obtain corrected depth profiles by confocal Raman microscopy, which
considers diffraction and refraction effects is presented. The problem of diffraction effects …

[PDF][PDF] Confocal Raman microscopy: how to correct depth profiles considering diffraction and refraction effects

A Gallardo, S Spells, R Navarro, H Reinecke - 2007 - academia.edu
The problem of diffraction effects encountered intrinsically in the confocal configuration can
be described using a linear Fredholm integral equation of the first kind, which correlates …

Confocal Raman microscopy: how to correct depth profiles considering diffraction and refraction effects

A Gallardo, S Spells, R Navarro… - Journal of Raman …, 2007 - ui.adsabs.harvard.edu
A new approach to obtain corrected depth profiles by confocal Raman microscopy, which
considers diffraction and refraction effects is presented. The problem of diffraction effects …

[PDF][PDF] Confocal Raman microscopy: how to correct depth profiles considering diffraction and refraction effects

A Gallardo, S Spells, R Navarro, H Reinecke - J. Raman Spectrosc, 2007 - academia.edu
The problem of diffraction effects encountered intrinsically in the confocal configuration can
be described using a linear Fredholm integral equation of the first kind, which correlates …

Confocal Raman microscopy: how to correct depth profiles considering diffraction and refraction effects

A Gallardo, SJ Spells, R Navarro… - Journal of Raman …, 2007 - shura.shu.ac.uk
A new approach to obtain corrected depth profiles by confocal Raman microscopy, which
considers diffraction and refraction effects is presented. The problem of diffraction effects …