Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies

G La Rosa, SE Rauch III - Microelectronics Reliability, 2007 - Elsevier
A review of the channel hot carrier (CHC) mechanism and its effects on n-MOSFET devices
of deep submicron CMOS bulk technologies is presented. Even with power supply reduction …
被引用次数：20 相关文章

Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies

G La Rosa, SE Rauch - Microelectronics Reliability, 2007 - ui.adsabs.harvard.edu
A review of the channel hot carrier (CHC) mechanism and its effects on n-MOSFET devices
of deep submicron CMOS bulk technologies is presented. Even with power supply reduction …

Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies

G La Rosa, SE Rauch - Microelectronics Reliability, 2007 - infona.pl
A review of the channel hot carrier (CHC) mechanism and its effects on n-MOSFET devices
of deep submicron CMOS bulk technologies is presented. Even with power supply reduction …

[引用][C] Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies.

G La Rosa, R SE III - Microelectronics reliability, 2007 - dialnet.unirioja.es
Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies. -
Dialnet Ayuda ¿En qué podemos ayudarle? × Buscar en la ayuda Buscar Consultar la ayuda …

[引用][C] Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies

G LA ROSA, SE RAUCH - Microelectronics and reliability, 2007 - pascal-francis.inist.fr
Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS
technologies CNRS Inist Pascal-Francis CNRS Pascal and Francis Bibliographic Databases …