Atomic Force Microscope Studies of Fullerene Films: Highly Stable C60 fcc (311) Free Surfaces
Science, 1991•science.org
Atomic force microscopy and x-ray diffractometry were used to study 1500 Å-thick films of
pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrate.
Topographs of the films did not reveal the expected close-packed structures, but they
showed instead large regions that correspond to a face-centered cubic (311) surface and
distortions of this surface. The open (311) structure may have a relatively low free energy
because the low packing density contributes to a high entropy of the exposed surface.
pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrate.
Topographs of the films did not reveal the expected close-packed structures, but they
showed instead large regions that correspond to a face-centered cubic (311) surface and
distortions of this surface. The open (311) structure may have a relatively low free energy
because the low packing density contributes to a high entropy of the exposed surface.
Atomic force microscopy and x-ray diffractometry were used to study 1500 Å-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.
AAAS以上显示的是最相近的搜索结果。 查看全部搜索结果