Item families, which are groups of related items, are becoming increasingly popular in
complex educational assessments. For example, in automatic item generation (AIG)
systems, a test may consist of multiple items generated from each of a number of item
models. Item calibration or scoring for such an assessment requires fitting models that can
take into account the dependence structure inherent among the items that belong to the
same item family. Glas and van der Linden (2001) suggest a Bayesian hierarchical model to …

Calibrating item families and summarizing the results using family expected response
functions - Dialnet … Calibrating item families and summarizing the results using family
expected response functions …