Two methods on how to obtain the full diffraction information from a sample region and the
associated reconstruction of images or diffraction patterns using virtual apertures are
demonstrated. In a STEM-based approach, diffraction patterns are recorded for each beam
position using a small probe convergence angle. Similarly, a tilt series of TEM dark-field
images is acquired. The resulting datasets allow the reconstruction of either electron
diffraction patterns, or bright-, dark-or annular dark-field images using virtual apertures. The …