[HTML][HTML] Direct observation of resistive heating at graphene wrinkles and grain boundaries
We directly measure the nanometer-scale temperature rise at wrinkles and grain boundaries
(GBs) in functioning graphene devices by scanning Joule expansion microscopy with∼ 50
nm spatial and∼ 0.2 K temperature resolution. We observe a small temperature increase at
select wrinkles and a large (∼ 100 K) temperature increase at GBs between coalesced
hexagonal grains. Comparisons of measurements with device simulations estimate the GB
resistivity (8–150 Ω μm) among the lowest reported for graphene grown by chemical vapor …
(GBs) in functioning graphene devices by scanning Joule expansion microscopy with∼ 50
nm spatial and∼ 0.2 K temperature resolution. We observe a small temperature increase at
select wrinkles and a large (∼ 100 K) temperature increase at GBs between coalesced
hexagonal grains. Comparisons of measurements with device simulations estimate the GB
resistivity (8–150 Ω μm) among the lowest reported for graphene grown by chemical vapor …
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