Thin films of titanium dioxide (TiO₂) were synthesized by sol gel (spin coating) process on glass substrates. The structural, morphological, optical, and electrical properties of TiO₂ thin films were examined as a function of solution concentration C_S varied between 0.1 M and 0.5 M at 500°C as the annealing temperature. The elaborate samples were characterized by several characterization methods such as X-ray diffraction (XRD), scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FTIR), UV-VISIBLE spectroscopy and two points probe. The obtained results show that the TiO₂ samples were crystallized in a tetragonal structure (anatase phase) oriented preferentially along to the (101) plane. The average grain size increases from 34.773 ± 1.738 nm to 48.674 ± 2.433 nm. The FTIR spectrum shows the presence of Ti-O and Ti-O-Ti bonds. The samples are transparent in visible and the indirect optical band gap varies from 3.09 ± 0.154 eV to 3.415 ± 0.170 eV. In addition, the electrical measurements show a minimum electrical resistivity (ρ = 0.18 ± 0.01 Ω.cm) at C_S = 0.3 M .